D. McCarthy

Radiation Effects Introduced by X-Ray Lithography in MOS Devices

M. Peckerar, C. Dozier, D. Brown, 1982, IEEE Transactions on Nuclear Science.

Lateral distribution of hot-carrier-induced interface traps in MOSFETs

D. McCarthy, M. Ancona, N. Saks, 1988 .

An active microelectronic transducer for enabling label-free miniaturized chemical sensors

D. McCarthy, M. Peckerar, D. McCarthy, 2000, International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138).

Reactive-ion etching of tungsten for high-resolution x-ray masks

Martin C. Peckerar, Charles R. Eddy, Christie R. Marrian, 1994, Advanced Lithography.

Double-crystal X-ray topography characterization of an electrical-bias-induced stress variation in metal-oxide-semiconductor field effect transistors

M. Peckerar, D. McCarthy, D. Ma, 1991 .

Deep-depletion CCDs with improved UV sensitivity

D. McCarthy, M. Peckerar, D. McCarthy, 1985, 1985 International Electron Devices Meeting.