K. Johansson

Neutron induced single-word multiple-bit upset in SRAM

K. Johansson, M. Ohlsson, N. Olsson, 1999 .

In-flight and ground testing of single event upset sensitivity in static RAMs

K. Johansson, P. Dyreklev, B. Granbom, 1997 .

In-flight and ground testing of single event upset sensitivity in static RAMs

P. Dyreklev, B. Granbom, S. Fourtine, 1997, RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294).

Energy-resolved neutron SEU measurements from 22 to 160 MeV

P. Dyreklev, Jan Blomgren, B. Granbom, 1998 .

Neutron single event upsets in SRAM-based FPGAs

P. Dyreklev, P. Alfke, K. Johansson, 1998, 1998 IEEE Radiation Effects Data Workshop. NSREC 98. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.98TH8385).

The single event upset environment for avionics at high latitude

J. Farren, Andrew Sims, C. S. Dyer, 1994 .