P. Marshall

发表

Heavy ion and proton-induced single event multiple upset

R. Reed, O. Musseau, T. Corbiere, 1997 .

The effects of operating bias conditions on the proton tolerance of SiGe HBTs

R. Reed, P. Marshall, C. Marshall, 2003 .

The effects of proton irradiation on the lateral and vertical scaling of UHV/CVD SiGe HBT BiCMOS technology

P. Marshall, C. Marshall, G. Freeman, 2000 .

Proton tolerance of fourth-generation 350 GHz UHV/CVD SiGe HBTs

Wei-Min Lance Kuo, R. Reed, P. Marshall, 2004, IEEE Transactions on Nuclear Science.

Proton tolerance of advanced SiGe HBTs fabricated on different substrate materials

Wei-Min Lance Kuo, R. Reed, P. Marshall, 2004, IEEE Transactions on Nuclear Science.

Modeling of single-event effects in circuit-hardened high-speed SiGe HBT logic

R. Reed, P. Marshall, C. Marshall, 2001 .

Proton tolerance of third-generation, 0.12 /spl mu/m 185 GHz SiGe HBTs

R. Reed, P. Marshall, J. Cressler, 2003 .

Proton radiation effects in vertical SiGe HBTs fabricated on CMOS-compatible SOI

Jin Cai, Qingqing Liang, P. Marshall, 2005, IEEE Transactions on Nuclear Science.

1/f noise in proton-irradiated SiGe HBTs

R. Reed, P. Marshall, C. Marshall, 2001 .

An investigation of the origins of the variable proton tolerance in multiple SiGe HBT BiCMOS technology generations

R. Reed, P. Marshall, J. Cressler, 2002 .

Proton radiation response of monolithic Millimeter-wave transceiver building blocks implemented in 200 GHz SiGe technology

Wei-Min Lance Kuo, R. Reed, P. Marshall, 2004, IEEE Transactions on Nuclear Science.

Heavy-ion broad-beam and microprobe studies of single-event upsets in 0.20-/spl mu/m SiGe heterojunction bipolar transistors and circuits

J. C. Pickel, R. Reed, M. Carts, 2003 .

Single event effects in circuit-hardened SiGe HBT logic at gigabit per second data rates

R. Reed, S. Buchner, M. Carts, 2000 .

Proton radiation response of SiGe HBT analog and RF circuits and passives

R. Reed, P. Marshall, C. Marshall, 2001 .

Performance of the high-energy single-event effects test Facility (SEETF) at Michigan State university's national Superconducting Cyclotron laboratory (NSCL)

R.A. Reed, K.A. LaBel, R. Fox, 2004, IEEE Transactions on Nuclear Science.

Single event upsets in the dual-port-board SRAMs of the MPTB experiment

Paul W. Marshall, Cheryl J. Marshall, Robert A. Reed, 1999 .

Comparison of Measured Dark Current Distributions With Calculated Damage Energy Distributions in HgCdTe

R. Reed, M. Mendenhall, P. Marshall, 2007, IEEE Transactions on Nuclear Science.

Hot pixel annealing behavior in CCDs irradiated at -84/spl deg/C

G. Delo, A. Waczynski, T. Beck, 2005, IEEE Transactions on Nuclear Science.

Single Particle Damage Events in Candidate Star Camera Sensors

Scott D. Johnson, P. Marshall, C. Marshall, 2005 .

CCD Radiation Effects and Test Issues for Satellite Designers

Paul W. Marshall, Cheryl J. Marshall, P. Marshall, 2003 .

Proton effects in charge-coupled devices

P. Marshall, G. Hopkinson, C. Dale, 1996 .

Particle-induced spatial dark current fluctuations in focal plane arrays

Cheryl J. Dale, P. W. Marshall, E. A. Burke, 1990 .

Hot Pixel Annealing Behavior in CCDs Irradiated at-84 ° C

R. J. Hill, P. W. Marshall, G. Delo, .

Displacement damage extremes in silicon depletion regions

Cheryl J. Dale, P. W. Marshall, E. A. Burke, 1989 .

Impact of Proton Irradiation on the RF Performance of 65 nm SOI CMOS Technology

P. Marshall, J. Cressler, G. Freeman, 2009, IEEE Transactions on Nuclear Science.

The Enhanced Role of Shallow-Trench Isolation in Ionizing Radiation Damage of 65 nm RF-CMOS on SOI

Qingqing Liang, G. Freeman, R. Arora, 2009, IEEE Transactions on Nuclear Science.

Impact of proton irradiation on the RF performance of 65 nm SOI CMOS technology

P. Marshall, J. Cressler, G. Freeman, 2008, 2008 European Conference on Radiation and Its Effects on Components and Systems.

Proton-induced displacement damage distributions and extremes in silicon microvolumes charge injection device

Cheryl J. Dale, P. W. Marshall, E. A. Burke, 1990 .

A comparison of Monte Carlo and analytic treatments of displacement damage in Si microvolumes

Cheryl J. Dale, P. W. Marshall, E. A. Burke, 1994 .

Heavy ion transient characterization of a hardened-by-design active pixel sensor array

Kenneth A. LaBel, Paul W. Marshall, Cheryl J. Marshall, 2002, IEEE Radiation Effects Data Workshop.

Radiation-induced charge collection in infrared detector arrays

Paul W. Marshall, Raymond L. Ladbury, Robert A. Reed, 2002 .

The generation lifetime damage factor and its variance in silicon

P. Marshall, C. Dale, E. Burke, 1989 .

Proton-induced displacement damage fluctuations in silicon microvolumes

P. Marshall, C. Dale, E. Burke, 1991 .

Single Event Transient Response of SiGe Voltage References and Its Impact on the Performance of Analog and Mixed-Signal Circuits

M. Turowski, A. Raman, G. Vizkelethy, 2009, IEEE Transactions on Nuclear Science.

High energy electron induced displacement damage in silicon

E. A. Wolicki, P. Marshall, C. Dale, 1988 .

Energy dependence of proton damage in AlGaAs light-emitting diodes

R. Reed, P. Marshall, C. Marshall, 2000 .

Single-event effects ground testing and on-orbit rate prediction methods: the past, present, and future

J. C. Pickel, R. Reed, S. Buchner, 2003 .

Low Energy Proton Single-Event-Upset Test Results on 65 nm SOI SRAM

P. Marshall, P. Dodd, K. Label, 2008, IEEE Transactions on Nuclear Science.

Impact of Spacecraft Shielding on Direct Ionization Soft Error Rates for Sub-130 nm Technologies

P. Marshall, R. Ladbury, J. Pellish, 2010, IEEE Transactions on Nuclear Science.

The Susceptibility of 45 and 32 nm Bulk CMOS Latches to Low-Energy Protons

P. Marshall, K. Label, N. Seifert, 2011, IEEE Transactions on Nuclear Science.

Hardness Assurance Testing for Proton Direct Ionization Effects

S. E. Swanson, S. M. Dalton, R. Reed, 2011, IEEE Transactions on Nuclear Science.

Hardness Assurance for Proton Direct Ionization-Induced SEEs Using a High-Energy Proton Beam

S. E. Swanson, R. Reed, P. Marshall, 2014, IEEE Transactions on Nuclear Science.

Criticality of Low-Energy Protons in Single-Event Effects Testing of Highly-Scaled Technologies

Hak S. Kim, P. Marshall, K. Label, 2014, IEEE Transactions on Nuclear Science.

New Insights Gained on Mechanisms of Low-Energy Proton-Induced SEUs by Minimizing Energy Straggle

R. Reed, P. Marshall, P. Dodd, 2015, IEEE Transactions on Nuclear Science.

The Contribution of Low-Energy Protons to the Total On-Orbit SEU Rate

S. E. Swanson, R. Reed, P. Marshall, 2015, IEEE Transactions on Nuclear Science.

32 and 45 nm Radiation-Hardened-by-Design (RHBD) SOI Latches

P. Marshall, K. Label, K. Stawiasz, 2011, IEEE Transactions on Nuclear Science.

A 2 mW, Sub-2 dB Noise Figure, SiGe Low-Noise Amplifier For X-band High-Altitude or Space-based Radar Applications

P. Marshall, J. Cressler, A. Sutton, 2007, 2007 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium.

Evidence for angular effects in proton-induced single-event upsets

K. A. LaBel, Paul W. Marshall, Raymond L. Ladbury, 2002 .

On the Radiation Tolerance of SiGe HBT and CMOS-Based Phase Shifters for Space-Based, Phased-Array Antenna Systems

P. Marshall, J. Cressler, J. Comeau, 2008, IEEE Transactions on Nuclear Science.

A study of the SEU performance of InP and SiGe shift registers

P. Chu, D.L. Hansen, M.A. Carts, 2005, IEEE Transactions on Nuclear Science.

Single Event Upset Mechanisms for Low-Energy-Deposition Events in SiGe HBTs

G. Espinel, G. Vizkelethy, J.P. Comeau, 2008, IEEE Transactions on Nuclear Science.

A Generalized SiGe HBT Single-Event Effects Model for On-Orbit Event Rate Calculations

R. Krithivasan, M.A. Carts, peixiong zhao, 2007, IEEE Transactions on Nuclear Science.

Heavy ion and proton analysis of a GaAs C-HIGFET SRAM

Paul W. Marshall, A. Peczalski, A. B. Campbell, 1993 .

Impact of deep trench isolation on advanced SiGe HBT reliability in radiation environments

R. Reed, A. Grillo, P. Marshall, 2009, 2009 IEEE International Reliability Physics Symposium.

Heavy Ion Microbeam- and Broadbeam-Induced Transients in SiGe HBTs

M. Turowski, A. Raman, J. Baggio, 2009, IEEE Transactions on Nuclear Science.

Energy Dependence of Proton Displacement Damage Factors for Bipolar Transistors

E. A. Wolicki, P. Marshall, C. Dale, 1986, IEEE Transactions on Nuclear Science.

Hardness assurance testing for proton direct ionization effects

S. E. Swanson, S. M. Dalton, R. Reed, 2011, 2011 12th European Conference on Radiation and Its Effects on Components and Systems.

A roadmap for NASA's radiation effects research in emerging microelectronics and photonics

R.A. Reed, K.A. LaBel, C.E. Barnes, 2000, 2000 IEEE Aerospace Conference. Proceedings (Cat. No.00TH8484).

Survivable fiber-based data links for satellite radiation environments

Kenneth A. LaBel, Paul W. Marshall, Cheryl J. Dale, 1993, Optics East.

MPTB Radiation Effects Study on the DR 1773 Fiber Optics Data Bus

P. Marshall, C. Marshall, K. Label, 2005 .

Proton Effects and Test Issues for Satellite Designers. Section 4; Displacement Effects

P. Marshall, C. Marshall, 2013 .

Anomalous radiation effects in fully depleted SOI MOSFETs fabricated on SIMOX

R. Reed, P. Marshall, C. Marshall, 2001 .

2 Task on Photonic Technology : Rate Prediction Tool Assessment for Single Event Transient Errors on Optical Link Receivers and Optocouplers Executive

P. Marshall, 2002 .

Lateral Diffusion Length Changes in HgCdTe Source of Acquisition

P. Marshall, C. Marshall, M. Gramer, 2007 .

Monte carlo treatment of displacement damage in bandgap engineered HgCdTe detectors

J. C. Pickel, R. Reed, P. Marshall, 2004, Proceedings of the 7th European Conference on Radiation and Its Effects on Components and Systems, 2003. RADECS 2003..

Single Event Transient Hardness of a New Complementary (npn $+$ pnp) SiGe HBT Technology on Thick-Film SOI

J. Babcock, P. Marshall, C. Marshall, 2010, IEEE Transactions on Nuclear Science.

Test methodology for characterizing the SEE response of a commercial IEEE 1394 serial bus (FireWire)

K. A. LaBel, S. P. Buchner, Paul W. Marshall, 2002 .

Characteristics of single-event upsets in a fabric switch (AD8151)

S. Buchner, M. Carts, P. Marshall, 2004, IEEE Transactions on Nuclear Science.

Characteristics of single-event upsets in a fabric switch (AD8151)

S. Buchner, M. Carts, P. Marshall, 2003, Proceedings of the 7th European Conference on Radiation and Its Effects on Components and Systems, 2003. RADECS 2003..

Investigation of the oxygen-vacancy (A-center) defect complex profile in neutron irradiated high resistivity silicon junction particle detectors

H. Kraner, P. Marshall, P. Rancoita, 1992 .

Proton radiation effects in 4H-SiC diodes and MOS capacitors

B.M. Haugerud, R. Reed, P. Marshall, 2004, IEEE Transactions on Nuclear Science.

The Effects of Proton and X-Ray Irradiation on the DC and AC Performance of Complementary (npn + pnp) SiGe HBTs on Thick-Film SOI

peixiong zhao, P. Marshall, J. Cressler, 2007, IEEE Transactions on Nuclear Science.

Proton Tolerance of InAs Based HEMT and DHBT Devices

P. Marshall, B. Gilbert, B. Brar, 2006, 2006 IEEE Radiation Effects Data Workshop.

Heavy Ion Testing With Iron at 1 GeV/amu

Hak S. Kim, peixiong zhao, R. Reed, 2010, IEEE Transactions on Nuclear Science.

Heavy ion testing at the galactic cosmic ray energy peak

Hak S. Kim, peixiong zhao, R. Reed, 2009, 2009 European Conference on Radiation and Its Effects on Components and Systems.

Charge-collection characteristics of GaAs heterostructure FETs fabricated with a low-temperature grown GaAs buffer layer

S. Buchner, P. Marshall, J. Melinger, 1995, Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems.

Characteristics of the Hubble Space Telescope's radiation environment inferred from charge-collection modeling of Near-Infrared Camera and Multi-Object Spectrometer dark frames

J. C. Pickel, R. Reed, P. Marshall, 2002 .

Modeling radiation-induced transients in the Next Generation Space Telescope (NGST)

J. C. Pickel, R. Reed, P. Marshall, 2002, Proceedings, IEEE Aerospace Conference.

Three-dimensional Simulation of heavy-ion induced charge collection in SiGe HBTs on SOI

Guofu Niu, R. Reed, P. Marshall, 2004, IEEE Transactions on Nuclear Science.

Review of displacement damage effects in silicon devices

J. R. Srour, C. J. Marshall, P. W. Marshall, 2003 .

Multiple-Bit Upset in 130 nm CMOS Technology

J.D. Cressler, B. Sierawski, R.A. Reed, 2006, IEEE Transactions on Nuclear Science.

Correlation of Particle-Induced Displacement Damage in Silicon

P. W. Marshall, E. A. Wolicki, E. A. Burke, 1987, IEEE Transactions on Nuclear Science.

Extreme Value Theory Applications to Space Radiation Damage Assessment in Satellite Microelectronics

P. Marshall, C. Dale, E. Burke, 1994, Journal of research of the National Institute of Standards and Technology.

Comparison of Proton and Neutron Carrier Removal Rates

E. W. Enlow, P. Marshall, R. Pease, 1987, IEEE Transactions on Nuclear Science.

Displacement damage effects in mixed particle environments for shielded spacecraft CCDs

P. W. Marshall, C. J. Dale, P. Marshall, 1993 .

Space radiation effects on optoelectronic materials and components for a 1300 nm fiber optic data bus

Cheryl J. Dale, P. W. Marshall, E. A. Burke, 1992 .

Displacement damage in GaAs structures

Cheryl J. Dale, Paul W. Marshall, E. A. Burke, 1988 .

An investigation of proton energy effects in SiGe HBT technology

John D. Cressler, Paul W. Marshall, Robert A. Reed, 2002 .

Impact of proton irradiation on the static and dynamic characteristics of high-voltage 4H-SiC JBS switching diodes

R. Reed, P. Marshall, D. Sheridan, 2003 .

Proton-induced transient effects in a metal-semiconductor-metal (MSM) photodetector for optical-based data transfer

Kenneth A. LaBel, Paul W. Marshall, Cheryl J. Marshall, 1998 .

Displacement damage in Si imagers for space applications

Cheryl J. Dale, P. W. Marshall, P. Marshall, 1991, Medical Imaging.

Displacement damage equivalent to dose in silicon devices

Cheryl J. Dale, P. W. Marshall, E. A. Wolicki, 1989 .

Proton radiation effects in 0.35 /spl mu/m partially depleted SOI MOSFETs fabricated on UNIBOND

John D. Cressler, Ying Li, Paul W. Marshall, 2002 .

3-D Simulation of SEU Hardening of SiGe HBTs Using Shared Dummy Collector

Guofu Niu, R. Reed, P. Marshall, 2007, IEEE Transactions on Nuclear Science.

A Novel Circuit-Level SEU Hardening Technique for High-Speed SiGe HBT Logic Circuits

J.D. Cressler, A.K. Sutton, P.W. Marshall, 2007, IEEE Transactions on Nuclear Science.

An Evaluation of Transistor-Layout RHBD Techniques for SEE Mitigation in SiGe HBTs

M. Turowski, A. Raman, G. Vizkelethy, 2007, IEEE Transactions on Nuclear Science.

Proton-induced SEU in SiGe digital logic at cryogenic temperatures

M.A. Carts, Guofu Niu, R. Reed, 2007, 2007 International Semiconductor Device Research Symposium.

Application of RHBD Techniques to SEU Hardening of Third-Generation SiGe HBT Logic Circuits

J.D. Cressler, B.A. Randall, B.K. Gilbert, 2006, IEEE Transactions on Nuclear Science.

Substrate Engineering Concepts to Mitigate Charge Collection in Deep Trench Isolation Technologies

G. Espinel, G. Vizkelethy, J.P. Comeau, 2006, IEEE Transactions on Nuclear Science.

An SEU hardening approach for high-speed SiGe HBT digital logic

John D. Cressler, Barry K. Gilbert, Paul W. Marshall, 2003 .

Single event upset test results on a prescaler fabricated in IBM's 5HP silicon germanium heterojunction bipolar transistors BiCMOS technology

John D. Cressler, K. A. LaBel, Paul W. Marshall, 2001, 2001 IEEE Radiation Effects Data Workshop. NSREC 2001. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.01TH8588).

An Investigation of Dose Rate and Source Dependent Effects in 200 GHz SiGe HBTs

Bongim Jun, M. Bellini, M.A. Carts, 2006, IEEE Transactions on Nuclear Science.

Proton, neutron and electron-induced displacement damage in germanium

Cheryl J. Dale, P. W. Marshall, E. A. Wolicki, 1989 .

An investigation of the effects of radiation exposure on stability constraints in epitaxial SiGe strained layers

P. Marshall, J. Cressler, A. Joseph, 2006 .

Particle-induced bit errors in high performance fiber optic data links for satellite data management

Kenneth A. LaBel, Cheryl J. Dale, P. W. Marshall, 1994 .

In-flight analysis of enabling technology

C.M. Seidleck, K.A. LaBel, A.K. Moran, 1997, 1997 IEEE Aerospace Conference.

Commercial microelectronics technologies for applications in the satellite radiation environment

K.A. LaBel, P.W. Marshall, C.M. Seidleck, 1996, 1996 IEEE Aerospace Applications Conference. Proceedings.