T. Bonifield
发表
Jie Sun,
Hanqing Li,
Anatol Khilo,
2011,
Optics express.
Tengfei Jiang,
P. S. Ho,
T. Bonifield,
2012,
2012 IEEE 62nd Electronic Components and Technology Conference.
G. K. Walters,
T. Bonifield,
D. Lorents,
1980
.
P. Chatterjee,
T. Bonifield,
M. Elahy,
1984,
IEEE Electron Device Letters.
G. K. Walters,
T. Bonifield,
J. Keto,
1976
.
T. Bonifield,
C. Pico,
1993
.
Microstructural characterization of Al_98.5wt. %Si_1.0wt. %Cu_0.5wt. % on chemical-vapor-deposited W
T. Bonifield,
C. Pico,
1993
.
Joe W. McPherson,
M. K. Jain,
William R. McKee,
2002,
2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320).
J. D. Luttmer,
T. Bonifield,
J. West,
2001,
Proceedings of the IEEE 2001 International Interconnect Technology Conference (Cat. No.01EX461).
G. K. Walters,
T. Bonifield,
J. Keto,
1977
.
R. A. Gutcheck,
G. K. Walters,
T. Bonifield,
1981
.
T. Bonifield,
C. Pico,
1991,
1991 Proceedings Eighth International IEEE VLSI Multilevel Interconnection Conference.
L. Melton,
T. Bonifield,
R. Hawkins,
1988
.
Bill Y. Lin,
T. Bonifield,
F. Johnson,
2006,
2006 International Workshop on Junction Technology.
S. Crank,
T. Bonifield,
H. Mogul,
2005,
Microscopy and Microanalysis.
T. Bonifield,
R. Dunne,
P. Steinmann,
2012,
2012 IEEE 62nd Electronic Components and Technology Conference.
Hisashi Shichijo,
Tom Bonifield,
Honglin Guo,
2020,
2020 IEEE International Reliability Physics Symposium (IRPS).
Ming C. Wu,
P. J. van Veldhoven,
R. Going,
2022
.
T. Bonifield,
C. Pico,
1991
.