S. Toh

Parameter-specific ring oscillator for process monitoring at the 45 nm node

Andrew R. Neureuther, Borivoje Nikolic, Tsu-Jae King Liu, 2010, IEEE Custom Integrated Circuits Conference 2010.

Impact of random telegraph signaling noise on SRAM stability

Borivoje Nikolic, Tsu-Jae King Liu, Seng Oon Toh, 2011, 2011 Symposium on VLSI Technology - Digest of Technical Papers.

Technology Variability From a Design Perspective

Costas J. Spanos, B. Giraud, Kun Qian, 2011, IEEE Trans. Circuits Syst. I Regul. Pap..

Analysis of the relationship between random telegraph signal and negative bias temperature instability

B. Nikolić, T. Liu, C. Shin, 2010, 2010 IEEE International Reliability Physics Symposium.

Impact of random telegraph signals on Vmin in 45nm SRAM

Seng Oon Toh, Y. Tsukamoto, B. Nikolic, 2009, 2009 IEEE International Electron Devices Meeting (IEDM).

Energy-Performance Optimization of Synthesized Digital Integrated Circuits

S. Toh, 2008 .

Dynamic single-p-well SRAM bitcell characterization with back-bias adjustment for optimized wide-voltage-range SRAM operation in 28nm UTBB FD-SOI

R. Ranica, N. Planes, P. Flatresse, 2014, 2014 IEEE International Electron Devices Meeting.

SRAM Assist Techniques for Operation in a Wide Voltage Range in 28-nm CMOS

Borivoje Nikolic, Olivier Thomas, Krste Asanovic, 2012, IEEE Transactions on Circuits and Systems II: Express Briefs.