Hak Kim

发表

The effects of operating bias conditions on the proton tolerance of SiGe HBTs

R. Reed, P. Marshall, C. Marshall, 2003 .

The effects of proton irradiation on the lateral and vertical scaling of UHV/CVD SiGe HBT BiCMOS technology

P. Marshall, C. Marshall, G. Freeman, 2000 .

1/f noise in proton-irradiated SiGe HBTs

R. Reed, P. Marshall, C. Marshall, 2001 .

An investigation of the origins of the variable proton tolerance in multiple SiGe HBT BiCMOS technology generations

R. Reed, P. Marshall, J. Cressler, 2002 .

Proton radiation response of SiGe HBT analog and RF circuits and passives

R. Reed, P. Marshall, C. Marshall, 2001 .

Energy dependence of proton damage in AlGaAs light-emitting diodes

R. Reed, P. Marshall, C. Marshall, 2000 .

Evidence for angular effects in proton-induced single-event upsets

K. A. LaBel, Paul W. Marshall, Raymond L. Ladbury, 2002 .

Anomalous radiation effects in fully depleted SOI MOSFETs fabricated on SIMOX

R. Reed, P. Marshall, C. Marshall, 2001 .

Test methodology for characterizing the SEE response of a commercial IEEE 1394 serial bus (FireWire)

K. A. LaBel, S. P. Buchner, Paul W. Marshall, 2002 .

Characteristics of single-event upsets in a fabric switch (AD8151)

S. Buchner, M. Carts, P. Marshall, 2003, Proceedings of the 7th European Conference on Radiation and Its Effects on Components and Systems, 2003. RADECS 2003..

An investigation of proton energy effects in SiGe HBT technology

John D. Cressler, Paul W. Marshall, Robert A. Reed, 2002 .

Proton radiation effects in 0.35 /spl mu/m partially depleted SOI MOSFETs fabricated on UNIBOND

John D. Cressler, Ying Li, Paul W. Marshall, 2002 .

Emerging optocoupler issues with energetic particle-induced transients and permanent radiation degradation

A. H. Johnston, K. A. LaBel, Paul W. Marshall, 1998 .

Proton-induced transients in optocouplers: in-flight anomalies, ground irradiation test, mitigation and implications

E. G. Stassinopoulos, Paul W. Marshall, Kenneth A. LaBel, 1997 .