G. Cherry

Semiconductor manufacturing process control and monitoring: A fab-wide framework

S. Joe Qin, Jin Wang, Richard Good, 2006 .

Introducing a Unified PCA Algorithm for Model Size Reduction

G. Cherry, R. Good, Daniel Kost, 2010, IEEE Transactions on Semiconductor Manufacturing.

Methods for improving the reliability of semiconductor fault detection and diagnosis with principal component analysis

Gregory Allan Cherry, G. Cherry, 2006 .

Multiblock principal component analysis based on a combined index for semiconductor fault detection and diagnosis

S.J. Qin, G.A. Cherry, S. Qin, 2006, IEEE Transactions on Semiconductor Manufacturing.