T. Sullivan
发表
W. Landers,
R. Volant,
M. Farooq,
2011,
2011 International Electron Devices Meeting.
K. Watson,
T. Sullivan,
J. Gill,
2004,
2004 IEEE International Reliability Physics Symposium. Proceedings.
T. Sullivan,
F. Chen,
O. Bravo,
2006,
2006 IEEE International Reliability Physics Symposium Proceedings.
T. Sullivan,
Tom C. Lee,
M. Ruprecht,
2002,
2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320).
E. Yashchin,
T. Sullivan,
J. Gill,
2006,
2006 IEEE International Reliability Physics Symposium Proceedings.
J. G. Ryan,
T. Sullivan,
A. Puttlitz,
1989
.
Jordi Suñé,
Ernest Y. Wu,
Timothy D. Sullivan,
2009
.
O. Aubel,
T. Sullivan,
O. Aubel,
2007,
IEEE Transactions on Device and Materials Reliability.
J. Gill,
C.-C. Yang,
A. Cowley,
2004,
2004 IEEE International Reliability Physics Symposium. Proceedings.
T. Sullivan,
F. Chen,
J. Gill,
2004,
IEEE International Integrated Reliability Workshop Final Report, 2004.
D. Tibel,
T. D. Sullivan,
T. Sullivan,
2001,
2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167).
T. Sullivan,
D. Tibel,
T. Lee,
2000,
2000 IEEE International Integrated Reliability Workshop Final Report (Cat. No.00TH8515).
Timothy D. Sullivan,
D. Tibel,
T. Sullivan,
2000,
2000 IEEE International Integrated Reliability Workshop Final Report (Cat. No.00TH8515).
Timothy D. Sullivan,
Jason P. Gill,
D. Harmon,
1998,
1998 IEEE International Integrated Reliability Workshop Final Report (Cat. No.98TH8363).
T. Sullivan,
Baozhen Li,
Fen Chen,
1999
.
T. Sullivan,
L. Miller,
1993
.
J. Gill,
K. Rodbell,
J. Gambino,
2007,
2007 IEEE International Interconnect Technology Conferencee.
Harry A. Schafft,
Linda M. Head,
J. A. Lechner,
2000
.
T. Sullivan,
F. Chen,
B. Li,
2006,
2006 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits.
J. Gill,
M. Shinosky,
T. Ema,
2005,
2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual..
T. Sullivan,
J. Gambino,
J. Gill,
2007
.
J. G. Ryan,
T. Sullivan,
G. Slusser,
1989
.
T. Sullivan,
H. Blumtritt,
A. Höpner,
1991
.
T. Sullivan,
J. Slinkman,
L. Borucki,
1988,
Technical Digest., International Electron Devices Meeting.
T. Sullivan,
D. Ast,
1985
.
Fen Chen,
Jeffrey P. Gambino,
Timothy D. Sullivan,
2009,
2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.
Baozhen Li,
Timothy D. Sullivan,
Dinesh Badami,
2004,
Microelectron. Reliab..
Robert Rosenberg,
Ronald G. Filippi,
Richard A. Wachnik,
2002
.
Influence of underlying interlevel dielectric films on extrusion formation in aluminum interconnects
Baozhen Li,
Fen Chen,
James Kolodzey,
2000
.
Timothy D. Sullivan,
T. Sullivan,
1999
.
T. Sullivan,
1996
.
Emmanuel Yashchin,
Baozhen Li,
Ronald G. Filippi,
2006
.
Timothy D. Sullivan,
James M. Powers,
T. Sullivan,
1978
.
T. Sullivan,
E. Wu,
R. Vollertsen,
2009
.
T. Sullivan,
E. Wu,
R. Vollertsen,
2009
.
James L. Walsh,
Huntington W. Curtis,
James F. Ziegler,
1996,
IBM J. Res. Dev..
Timothy D. Sullivan,
T. Sullivan,
P. Bo,
1991
.
G. J. Scott,
T. Sullivan,
K. Tunga,
2012,
2012 IEEE 62nd Electronic Components and Technology Conference.
J. G. Ryan,
T. Sullivan,
D. Knorr,
1993
.
Kim Y. Lee,
Chao-Kun Hu,
Kenneth P. Rodbell,
1995,
IBM J. Res. Dev..
Baozhen Li,
P S McLaughlin,
J P Bickford,
2011,
IEEE Transactions on Device and Materials Reliability.