W. Lai
发表
W. S. Lindenberger,
A. C. Dumbri,
G. Alers,
2000,
Proceedings of the IEEE 2000 Custom Integrated Circuits Conference (Cat. No.00CH37044).
W. Lai,
F. Baumann,
D. Monroe,
1999,
International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318).
W. Lai,
C. Pai,
J. Miner,
2000,
Proceedings of the IEEE 2000 International Interconnect Technology Conference (Cat. No.00EX407).
W. Lai,
T. Sorsch,
V. Aksyuk,
2007,
IEEE Transactions on Advanced Packaging.
C. R. Giles,
C. D. White,
A. Gnauck,
2001,
OFC 2001. Optical Fiber Communication Conference and Exhibit. Technical Digest Postconference Edition (IEEE Cat. 01CH37171).
Nagesh R. Basavanhally,
J. F. Miner,
J. E. Bower,
2009
.
J. F. Miner,
J. E. Bower,
Raymond A. Cirelli,
2007
.
J. T. Clemens,
H. Vaidya,
C. Liu,
1998,
1998 3rd International Symposium on Plasma Process-Induced Damage (Cat. No.98EX100).
J. T. Clemens,
G. Alers,
C. Liu,
1997,
1997 55th Annual Device Research Conference Digest.
W. Lai,
K. Cheung,
L. Kwakman,
1991,
1991 Proceedings Eighth International IEEE VLSI Multilevel Interconnection Conference.
W. Lai,
K. Cheung,
E. Granneman,
1990,
Seventh International IEEE Conference on VLSI Multilevel Interconnection.
W. Lai,
W. Brown,
J. Miner,
1998
.
J. T. Clemens,
E. J. Lloyd,
H. Vaidya,
1999,
1999 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.99CH36325).
A. Freeny,
W. Lai,
1997
.
J. E. Bower,
Dan M. Marom,
Chorng-Ping Chang,
2003
.
W.Y.C. Lai,
C. Liu,
W. Lai,
1997,
International Electron Devices Meeting. IEDM Technical Digest.
Durga Misra,
K. P. Cheung,
C. Liu,
1997,
2nd International Symposium on Plasma Process-Induced Damage.
G. Alers,
H. Vaidya,
C. Liu,
1997,
International Electron Devices Meeting. IEDM Technical Digest.
W. Lai,
F. Baumann,
R. Liu,
1993,
Proceedings of IEEE International Electron Devices Meeting.
H. Vaidya,
C. Liu,
W. Lai,
1998,
1998 Symposium on VLSI Technology Digest of Technical Papers (Cat. No.98CH36216).