T. Calin

Single Event Effects in Static and Dynamic Registers in a 0 . 25 μ m CMOS Technology

F. Faccio, K. Kloukinas, A. Marchioro, 1999 .

Upset hardened memory design for submicron CMOS technology

T. Calin, M. Nicolaidis, R. Velazco, 1996 .

A low-cost, highly reliable SEU-tolerant SRAM: prototype and test results

T. Calin, M. Nicolaidis, R. Velazco, 1995 .

SEU-hardened storage cell validation using a pulsed laser

T. Calin, M. Nicolaidis, R. Velazco, 1996 .

Study of the Radiation Tolerance of ICs for LHC Co-Spokespersons :

Cechak, A. Paccagnella, W. Dabrowski, 1999 .

Total dose and Single Event Effects (SEE) in a 0.25 µm CMOS technology

Federico Faccio, Michael Campbell, Walter Snoeys, 1998 .

Deep submicron CMOS technologies for the LHC experiments

Federico Faccio, A. Marchioro, Alessandro Paccagnella, 1999 .