H. Fujioka

发表

A Fully Computer-controlled Scanning Electron Microscopc

H. Fujioka, K. Nakamae, K. Ura, 1986 .

A new hemispherical retarding field energy analyser for quantitative voltage measurements in the SEM

Koji Nakamae, Hiromu Fujioka, H. Fujioka, 1985 .

Local field effects on voltage contrast in the scanning electron microscope

Koji Nakamae, Hiromu Fujioka, H. Fujioka, 1981 .

An open-loop spectroscopy for quantitative waveform measurements with the scanning electron microscope

H. Fujioka, K. Ura, 1985 .

A hemispherical retarding-field energy analyser with a microchannel plate detector and a high extraction field for voltage measurement in the scanning electron microscope

T. Takagi, H. Fujioka, K. Nakamae, 1986 .

Reflection of pulse by multiple-dielectric layers

H. Fujioka, T. Suzuki, E. Ogawa, 1975 .

Measurements of deep penetration of low‐energy electrons into metal‐oxide‐semiconductor structure

Koji Nakamae, Hiromu Fujioka, H. Fujioka, 1981 .

Gigahertz stroboscopy with the scanning electron microscope.

H. Fujioka, K. Ura, T. Hosokawa, 1978, The Review of scientific instruments.

Generation and measurement of subpicosecond electron beam pulses.

H. Fujioka, K. Ura, T. Hosokawa, 1978, The Review of scientific instruments.

Electron beam blanking systems

H. Fujioka, H. Fujioka, K. Ura, 1983 .

Analysis of the transit time effect on the stroboscopic voltage contrast in the scanning electron microscope

H. Fujioka, K. Nakamae, K. Ura, 1985 .

A Simple VLSI Spherical ParticleInduced ParticleInduced ParticleInduced Yield Predictor

H. Fujioka, K. Nakamae, H. Ohmori, 1999 .

Edge Roughness Study of Chemically Amplified Resist in Low-Energy Electron-Beam Lithography Using Computer Simulation

H. Fujioka, T. Nakasugi, A. Ando, 2002 .

Maskless lithography using low-energy electron beam: Recent results for proof-of-concept system

I. Mori, H. Fujioka, T. Nakasugi, 2002 .

Automatic EB fault-tracing system using fuzzy-logic approach

H. Fujioka, K. Nakamae, K. Miura, 2000 .

Electron beam testing in Japan

H. Fujioka, K. Ura, 1988 .

Benign Paroxysmal Positional Vertigo due to a Simultaneous Involvement of both Horizontal and Posterior Semicircular Canals

H. Fujioka, K. Nakamae, N. Takeda, 2006, Audiology and Neurotology.

Observation of Nuclear Excitation by Electron Transition (NEET) in 197Au with a Nanosecond Stroboscopic Electron Spectrometer

H. Fujioka, K. Ura, A. Shinohara, 1995 .

Nanosecond Stroboscopic Electron Spectroscopy for Observation of Nuclear Excitation by Electron Transition (NEET) in 197Au

H. Fujioka, K. Ura, 1985 .

100 ps resolution simple delay circuit for scanning electron microscope stroboscopy

H. Fujioka, K. Nakamae, K. Ura, 1984 .

Observation of nuclear excitation by electron transition (NEET) in197Au

H. Fujioka, K. Ura, A. Shinohara, 1984 .

Object size measurement method from noisy SEM images by utilizing scale space

Yoshihiro Midoh, Koji Nakamae, Hiromu Fujioka, 2007 .

Electron-beam-induced current in a chemical-vapour-deposited SiO2 passivation layer on an MOS structure with a non-penetrating electron beam

H. Fujioka, K. Nakamae, K. Ura, 1991 .

Picosecond Pulse Stroboscopic Scanning Electron Microscope

Hiromu Fujioka, H. Fujioka, K. Ura, 1978 .

Analysis of the high‐field domain dynamics in a planar Gunn diode by using a stroboscopic SEM

H. Fujioka, K. Ura, J. Koyama, 1979 .

Electron Beam Testing

H. Fujioka, H. Fujioka, K. Ura, 1989 .

Electron beam assisted high aspect ratio, submicrometre etching of passivation SiO2 on large-scale integrated circuits

Koji Nakamae, Hiromu Fujioka, H. Fujioka, 1992 .

Rotation vector analysis of eye movement in three dimensions with an infrared CCD camera.

K Nakamae, H. Fujioka, K. Nakamae, 1999, Acta oto-laryngologica.

Two‐dimensional observation of Gunn domains at 1 GHz by picosecond pulse stroboscopic SEM

Hiromu Fujioka, H. Fujioka, K. Ura, 1977 .

Potential measurements on floating-field-limiting rings in a power MOSFET by an electron beam probe

H. Fujioka, K. Nakamae, S. Komukai, 1995 .

Boundary extraction in the SEM cross-section of LSI

Yoshihiro Midoh, Katsuyoshi Miura, Koji Nakamae, 2001, SPIE Optics East.

Line edge roughness measurement of nanostructures in SEM metrology by using statistically matched wavelet

Yoshihiro Midoh, Koji Nakamae, Hiromu Fujioka, 2007, SPIE Optics East.

Comparing the accuracy of video-oculography and the scleral search coil system in human eye movement analysis.

Katsuyoshi Miura, Koji Nakamae, Hiromu Fujioka, 2005, Auris, nasus, larynx.

Intelligent EB test system for automatic VLSI fault tracing

Katsuyoshi Miura, Koji Nakamae, Hiromu Fujioka, 1999, Proceedings Eighth Asian Test Symposium (ATS'99).

Automatic fault tracing by successive circuit extraction from CAD layout data with the CAD-linked EB test system

Katsuyoshi Miura, Koji Nakamae, Hiromu Fujioka, 1998 .

Automatic EB fault tracing system by successive circuit extraction from VLSI CAD layout data

Katsuyoshi Miura, Koji Nakamae, Hiromu Fujioka, 1997, Proceedings Sixth Asian Test Symposium (ATS'97).

Hierarchical VLSI Fault Tracing by Successive Circuit Extraction from CAD Layout Data in the CAD-Linked EB Test System

Katsuyoshi Miura, Koji Nakamae, Hiromu Fujioka, 1997, J. Electron. Test..

Hierarchical fault tracing for VLSI sequential circuits from CAD layout data in the CAD-linked EB test system

Katsuyoshi Miura, Koji Nakamae, Hiromu Fujioka, 1997, Proceedings of ASP-DAC '97: Asia and South Pacific Design Automation Conference.

Three-Dimensional Eye Movement Simulator Extracting Instantaneous Eye Movement Rotation Axes, the Plane Formed by Rotation Axes, and Innervations for Eye Muscles

Hiromu Fujioka, Koji Nakamae, Takao Imai, 2003 .