C. Stroud
发表
C.E. Stroud,
R. R. Munoz,
R.R. Munoz,
1988,
IEEE Design & Test of Computers.
Kalyana R. Kantipudi,
V. Agrawal,
C. Stroud,
2006
.
C. Stroud,
M. Chung,
T. Raju Damarla,
1995,
Proceedings of ASP-DAC'95/CHDL'95/VLSI'95 with EDA Technofair.
C. Stroud,
2005
.
Kwang-Ting Cheng,
Charles E. Stroud,
Laung-Terng Wang,
2008,
Wiley Encyclopedia of Computer Science and Engineering.
C. Stroud,
R. Karri,
Shianling Wu,
2017
.
Charles E. Stroud,
Ahmed E. Barbour,
C. Stroud,
1989,
Proceedings. 'Meeting the Tests of Time'., International Test Conference.
Charles E. Stroud,
T. Raju Damarla,
Avinash Sathaye,
1995,
J. Electron. Test..
Foster F. Dai,
Charles E. Stroud,
Jie Qin,
2007,
IEEE Transactions on Industrial Electronics.
Charles E. Stroud,
C. A. Ryan,
C. Stroud,
1995,
Proceedings of Eighth International Application Specific Integrated Circuits Conference.
Foster F. Dai,
Charles E. Stroud,
Jie Qin,
2011,
IEEE Transactions on Industrial Electronics.
Foster F. Dai,
Charles E. Stroud,
Jie Qin,
2007,
2007 IEEE International Symposium on Circuits and Systems.
Nur A. Touba,
Charles E. Stroud,
Laung-Terng Wang,
2008
.
Shianling Wu,
F. Edward Crane,
Jack Kane,
1994,
AT&T Technical Journal.
Charles E. Stroud,
Ahmed E. Barbour,
C. Stroud,
1993,
J. Electron. Test..
Charles E. Stroud,
Miron Abramovici,
C. Stroud,
2001,
IEEE Trans. Very Large Scale Integr. Syst..
Wang,
C. Stroud,
N. Touba,
2007
.
Charles E. Stroud,
Joe K. Tannehill,
C. Stroud,
1998,
Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231).
Charles E. Stroud,
C. Stroud,
1991,
1991, Proceedings. International Test Conference.
C.E. Stroud,
C. Stroud,
1988,
IEEE Design & Test of Computers.
Charles E. Stroud,
C. Stroud,
1988,
25th ACM/IEEE, Design Automation Conference.Proceedings 1988..
Charles E. Stroud,
Laung-Terng Wang,
C. Stroud,
2010
.
Charles E. Stroud,
J. R. Heath,
S. Ramamoorthy,
1997
.
Charles E. Stroud,
Miron Abramovici,
John M. Emmert,
2007,
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
Tian Xia,
Charles E. Stroud,
Jack R. Smith,
2006,
J. Electron. Test..
Charles E. Stroud,
Miron Abramovici,
C. Stroud,
2002,
Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002).
Charles E. Stroud,
Miron Abramovici,
John M. Emmert,
2001,
Proceedings Third NASA/DoD Workshop on Evolvable Hardware. EH-2001.
Charles E. Stroud,
Ping Chen,
Miron Abramovici,
2000
.