Chong-Gun Yu

发表

NBTI and hot carrier effect of SOI p-MOSFETs fabricated in strained Si SOI wafer

Chong-Gun Yu, Jong-Tae Park, M. Saif Islam, 2009, Microelectron. Reliab..

Drain breakdown voltage: A comparison between junctionless and inversion mode p-channel MOSFETs

Chong-Gun Yu, Jong-Tae Park, Seung Min Lee, 2012, Microelectron. Reliab..

Device design guidelines for nano-scale MuGFETs

Jean-Pierre Colinge, Chong-Gun Yu, Chi-Woo Lee, 2007 .

RF performance degradation in nMOS transistors due to hot carrier effects

Chong-Gun Yu, Hyun-Kyu Yu, Dong Wook Kim, 2000 .

A Micro-Scale Solar Energy Harvesting Circuit with MPPT Control for Self-Powered Systems

Chong-Gun Yu, Eun-Jung Yoon, 2013 .

The impacts of SILC and hot carrier induced drain leakage current on the refresh time in DRAM

Sung H. Hong, J. T. Park, Chong-Gun Yu, 2000 .

Short Communication Temperature dependence of DTMOS transistor characteristics

Chong-Gun Yu, Jong-Tea Park, J. Colinge, 2004 .

Quantum-mechanical effects in nanometer scale MuGFETs

Jean-Pierre Colinge, Se Re Na Yun, Chong-Gun Yu, 2008 .

An accurate and matching-free threshold voltage extraction scheme for MOS transistors

Chong-Gun Yu, Randall L. Geiger, R. Geiger, 1994, Proceedings of IEEE International Symposium on Circuits and Systems - ISCAS '94.

Effect of source and drain asymmetry on hot carrier degradation in vertical nanowire MOSFETs

Jin-Woo Han, Chong-Gun Yu, Jae Hoon Lee, 2015, Microelectron. Reliab..

Effects of electrode materials on the device performances and instabilities in amorphous InGaZnO thin film transistors

Chong-Gun Yu, W. Cho, Jong-Tea Park, 2019, Microelectronics Reliability.

A digital tuning scheme for digitally programmable integrated continuous-time filters and techniques for high-precision monolithic linear circuit design and implementation

Chong-Gun Yu, Chong-Gun Yu, 1993 .

Power management circuits for self-powered systems based on micro-scale solar energy harvesting

Chong-Gun Yu, Eun-Jung Yoon, Chong-Gun Yu, 2016 .

New experimental findings on hot-carrier-induced degradation in lateral DMOS transistors

Chong-Gun Yu, Jong-Tae Park, Kyosun Kim, 2006, Microelectron. Reliab..

Design of a CMOS Tx RF/IF Single Chip for PCS Band Applications

Chong-Gun Yu, Jong-Tae Park, Yo-Sup Moon, 2003 .

Electrical Characteristics of RRAM with HfO 2 Annealing Temperatures and Thickness

Chong-Gun Yu, Jong-Tea Park, Jin-hyung Choi, 2014 .

Impact of work function of the silicon bottom-gates on electrical instability in InGaZnO thin film transistors

Chong-Gun Yu, Jong-Tae Park, Hyun Jun Jang, 2016, Microelectron. Reliab..

A comparative study on device degradation under a positive gate stress and hot carrier stress in InGaZnO thin film transistors

Chong-Gun Yu, Jong-Tae Park, Seung Min Lee, 2013, Microelectron. Reliab..

Hot carrier degradation of InGaZnO thin film transistors under light illumination at the elevated temperature

Won-Ju Cho, Chong-Gun Yu, W. Cho, 2012 .

Bulletin of Electrical Engineering and Informatics

Chong-Gun Yu, Jong-Tea Park, E. Yun, 2022 .

Thermal energy harvesting circuit with maximum power point tracking control for self-powered sensor node applications

Chong-Gun Yu, Jong-Tea Park, Eun-Jung Yoon, 2018, Frontiers of Information Technology & Electronic Engineering.

A Quantum Definition of Threshold Voltage in MuGFETs

J. T. Park, D. Lederer, Chong-Gun Yu, 2007, 2007 IEEE International SOI Conference.

The performance degradation of folded-cascode CMOS op-amp due to hot-carrier effects

Chong-Gun Yu, Jong-Tae Park, Hyun-Joong Kim, 1997, Proceedings of 40th Midwest Symposium on Circuits and Systems. Dedicated to the Memory of Professor Mac Van Valkenburg.

Lifetime prediction of InGaZnO thin film transistor for the application of display device and BEOL-transistors

Chong-Gun Yu, W. Cho, Sang Min Kim, 2018 .