Jong-Tea Park

发表

NBTI and hot carrier effect of SOI p-MOSFETs fabricated in strained Si SOI wafer

Chong-Gun Yu, Jong-Tae Park, M. Saif Islam, 2009, Microelectron. Reliab..

Drain breakdown voltage: A comparison between junctionless and inversion mode p-channel MOSFETs

Chong-Gun Yu, Jong-Tae Park, Seung Min Lee, 2012, Microelectron. Reliab..

Low-temperature conductance oscillations in junctionless nanowire transistors

Jong-Tea Park, Jin Young Kim, Chi-Woo Lee, 2010 .

Negative-bias-temperature-instability and hot carrier effects in nanowire junctionless p-channel multigate transistors

Jong-Tea Park, Jin Young Kim, J. Colinge, 2012 .

NBTI and hot carrier effect of Schottky-barrier p-MOSFETs

Jin-Young Kim, Jun-Seok Oh, Jong-Tae Park, 2010, Microelectron. Reliab..

Substrate bias and operating temperature effects on the performance of Schottky-barrier SOI nMOSFETs

D. Ka, W. Cho, Jong-Tea Park, 2008 .

3D‐Transistor Array Based on Horizontally Suspended Silicon Nano‐bridges Grown via a Bottom‐Up Technique

M. Islam, W. Cho, Jong-Tea Park, 2014, Advanced materials.

Device design guidelines for nano-scale MuGFETs

Jean-Pierre Colinge, Chong-Gun Yu, Chi-Woo Lee, 2007 .

RF performance degradation in nMOS transistors due to hot carrier effects

Chong-Gun Yu, Hyun-Kyu Yu, Dong Wook Kim, 2000 .

GIDL current characteristic in nanowire GAA MOSFETs with different channel Width

Jong-Tea Park, J. Ji, Yeong-ju Je, 2017 .

Device performances and instabilities of channel engineered amorphous InGaZnO thin film transistors

W. Cho, Jong-Tea Park, J. Lee, 2019, Microelectronics Reliability.

Device Degradation Under High Gate and Drain Bias Stress in IGZO Transistors

J. T. Park, Jong-Tea Park, S. M. Lee, 2013 .

The impact of substrate bias on the Z-RAM characteristics in n-channel junctionless MuGFETs

Jong-Tea Park, Seung-min Lee, 2014 .

Comparative Study on Off-State Breakdown Characteristics in Nanowire Junctionless and Inversion Mode Multiple Gate MOSFET

Jong-Tea Park, S. M. Lee, H. Jang, 2013 .

Device Design Guideline to Reduce the Threshold Voltage Variation with Fin Width in Junctionless MuGFETs

Jong-Tea Park, Seung-min Lee, 2014 .

Current-Voltage Characteristics with Substrate Bias in Nanowire Junctionless MuGFET

Jong-Tea Park, Jae-Ki Lee, 2012 .

P-15: Prediction Method of Device Instability in a-InGaZnO TFTs under Positive Gate Biases and Thermal Stresses using TCAD Simulation

J. T. Park, W. Cho, Jong-Tea Park, 2017 .

Device Degradation with Gate Lengths and Gate Widths in InGaZnO Thin Film Transistors

J. T. Park, Jong-Tea Park, Jae-Ki Lee, 2012 .

Steep subthreshold slope at elevated temperature in junctionless and inversion-mode MuGFET

Jong-Tea Park, Seung-min Lee, 2013 .

Short Communication Temperature dependence of DTMOS transistor characteristics

Chong-Gun Yu, Jong-Tea Park, J. Colinge, 2004 .

Quantum-mechanical effects in nanometer scale MuGFETs

Jean-Pierre Colinge, Se Re Na Yun, Chong-Gun Yu, 2008 .

Effect of source and drain asymmetry on hot carrier degradation in vertical nanowire MOSFETs

Jin-Woo Han, Chong-Gun Yu, Jae Hoon Lee, 2015, Microelectron. Reliab..

Effects of electrode materials on the device performances and instabilities in amorphous InGaZnO thin film transistors

Chong-Gun Yu, W. Cho, Jong-Tea Park, 2019, Microelectronics Reliability.

SOI dual-gate ISFET with variable oxide capacitance and channel thickness

W. Cho, Jong-Tea Park, H. Jang, 2014 .

New experimental findings on hot-carrier-induced degradation in lateral DMOS transistors

Chong-Gun Yu, Jong-Tae Park, Kyosun Kim, 2006, Microelectron. Reliab..

Nano-bridge enabled three-dimensional gate-all-around field effect transistors

M. Islam, W. Cho, Jong-Tea Park, 2014, 8th International Conference on Electrical and Computer Engineering.

Demonstration of gate-all-around FETs based on suspended CVD-grown silicon nanowires

M. Islam, Jong-Tea Park, Dong Yu, 2013, 2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S).

Fabrication of ambipolar gate-all-around field-effect transistors using silicon nanobridge arrays

M. Saif Islam, Jong-Tae Park, Jin-Yong Oh, 2013, Optics & Photonics - NanoScience + Engineering.

Design of a CMOS Tx RF/IF Single Chip for PCS Band Applications

Chong-Gun Yu, Jong-Tae Park, Yo-Sup Moon, 2003 .

Electrical Characteristics of RRAM with HfO 2 Annealing Temperatures and Thickness

Chong-Gun Yu, Jong-Tea Park, Jin-hyung Choi, 2014 .

Impact of work function of the silicon bottom-gates on electrical instability in InGaZnO thin film transistors

Chong-Gun Yu, Jong-Tae Park, Hyun Jun Jang, 2016, Microelectron. Reliab..

A comparative study on device degradation under a positive gate stress and hot carrier stress in InGaZnO thin film transistors

Chong-Gun Yu, Jong-Tae Park, Seung Min Lee, 2013, Microelectron. Reliab..

Hot carrier degradation of InGaZnO thin film transistors under light illumination at the elevated temperature

Won-Ju Cho, Chong-Gun Yu, W. Cho, 2012 .

Hot-carrier-induced device degradation in Schottky barrier ambipolar polysilicon transistor

D. Kim, W. Cho, Jong-Tea Park, 2021 .

Bulletin of Electrical Engineering and Informatics

Chong-Gun Yu, Jong-Tea Park, E. Yun, 2022 .

Thermal energy harvesting circuit with maximum power point tracking control for self-powered sensor node applications

Chong-Gun Yu, Jong-Tea Park, Eun-Jung Yoon, 2018, Frontiers of Information Technology & Electronic Engineering.

Pi-Gate SOI MOSFET

Jong-Tea Park, J. Colinge, C.H. Diaz, 2001, IEEE Electron Device Letters.

The performance degradation of folded-cascode CMOS op-amp due to hot-carrier effects

Chong-Gun Yu, Jong-Tae Park, Hyun-Joong Kim, 1997, Proceedings of 40th Midwest Symposium on Circuits and Systems. Dedicated to the Memory of Professor Mac Van Valkenburg.