R. Brederlow

发表

R. Thewes, P. Fromherz, M. Jenkner, 2003 .

Ralf Brederlow, Johannes Gerber, Vadim Ivanov, 2012, IEEE Journal of Solid-State Circuits.

R. Thewes, W. Weber, C. Schlunder, 1999, 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual (Cat. No.99CH36296).

R. Thewes, W. Weber, R. Brederlow, 1999, International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318).

R. Thewes, R. Brederlow, G. Wirth, 2004, IEEE Transactions on Electron Devices.

W. Simburger, K. Aufinger, R. Thewes, 2003, IEEE International Electron Devices Meeting 2003.

R. Brederlow, U. Zschieschang, C. Dehm, 2004, IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..

R. Brederlow, U. Zschieschang, C. Dehm, 2003, IEEE International Electron Devices Meeting 2003.

R. Thewes, R. Brederlow, P. Klein, 1998, 28th European Solid-State Device Research Conference.

R. Thewes, W. Weber, B. Holzapfl, 1998, International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217).

R. Thewes, U. Kollmer, R. Brederlow, 2000, IEEE Electron Device Letters.

Christian Paulus, Franz Hofmann, Ralf Brederlow, 2004 .

Tolga Arul, Stefan Katzenbeisser, Rolf Drechsler, 2021, 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE).

R. Thewes, R. Brederlow, G. Wirth, 2004, IEEE Transactions on Electron Devices.

A. Kahng, J. Ida, J. Hutchby, 1964, PS: Political Science & Politics.

R. Thewes, R. Brederlow, C. Paulus, 2004, Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850).

R. Thewes, R. Brederlow, C. Paulus, 2004, Proceedings of the 30th European Solid-State Circuits Conference.

Ralf Brederlow, Werner Weber, Roland Thewes, 2001 .

D. Schmitt-Landsiedel, W. Weber, R. Thewes, 1998, International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217).

Thomas Haneder, Christian Paulus, Franz Hofmann, 2005, Design, Automation and Test in Europe.

Ralf Brederlow, Purushothaman Srinivasan, Gilson Wirth, 2009, 2009 IEEE International Electron Devices Meeting (IEDM).

Doris Schmitt-Landsiedel, Ralf Brederlow, Roland Thewes, 2007, IEEE Journal of Solid-State Circuits.

R. Thewes, R. Brederlow, Jeongwook Koh, 2005, Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005..

D. Schmitt-Landsiedel, R. Thewes, R. Brederlow, 2004, 2004 Symposium on VLSI Circuits. Digest of Technical Papers (IEEE Cat. No.04CH37525).

Doris Schmitt-Landsiedel, Marc Tiebout, Christian Paulus, 2007, 2007 IEEE International Solid-State Circuits Conference. Digest of Technical Papers.

D. Schmitt-Landsiedel, R. Thewes, R. Brederlow, 2006, 2006 IEEE International Solid State Circuits Conference - Digest of Technical Papers.

D. Schmitt-Landsiedel, R. Thewes, R. Brederlow, 2003, 2003 IEEE International Solid-State Circuits Conference, 2003. Digest of Technical Papers. ISSCC..

R. Brederlow, G.I. Wirth, R. da Silva, 2007, IEEE Transactions on Electron Devices.

R. Thewes, R. Brederlow, C. Paulus, 2006, 2006 IEEE International Solid State Circuits Conference - Digest of Technical Papers.

Georg Sigl, Oscar M. Guillen, Ralf Brederlow, 2014, WESS '14.

R. Brederlow, B. Wolf, F. Kreupl, 2021, IEEE Sensors Letters.

Bernhard Wicht, Helmut Graeb, Ralf Brederlow, 2018, IEEE Journal of Solid-State Circuits.

C. Schlunder, B. Ankele, R. Thewes, 2001, 31st European Solid-State Device Research Conference.

H.S. Bennett, J.C. Costa, P.E. Cottrell, 2005, IEEE Transactions on Electron Devices.

Christian Paulus, Ralf Brederlow, Roland Thewes, 2001, ICECS 2001. 8th IEEE International Conference on Electronics, Circuits and Systems (Cat. No.01EX483).

Georg Sigl, Fabrizio De Santis, Oscar M. Guillen, 2016, FPS.

R. Brederlow, Ferdinand Pscheidl, F. Vanselow, 2022, 2022 IEEE International Symposium on Circuits and Systems (ISCAS).

Karl Goser, Ralf Brederlow, Roland Thewes, 2003, 2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual..

R. Brederlow, M. Brunner, M. Ortmanns, 2023, 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE).