Z. Weinberg

发表

Trench storage capacitors for high density DRAMs

Stephan A. Cohen, K. Stein, T. Rajeevakumar, 1991, International Electron Devices Meeting 1991 [Technical Digest].

High-Field Positive-Charge Generation and its Relation to Breakdown in a-SiO2

Z. Weinberg, 1988 .

A review of recent experiments pertaining to hole transport in Si3N4

Z. Weinberg, P. Arnett, 1978, IEEE Transactions on Electron Devices.

Hole conduction in Si3N4 films on Si

Z. Weinberg, 1976 .

The effect of gate metal and SiO2 thickness on the generation of donor states at the Si‐SiO2 interface

M. Fischetti, Z. Weinberg, J. A. Calise, 1985 .

Measurement of the steady−state potential difference across a thin insulating film in a corona discharge

W. C. Johnson, Z. Weinberg, M. Lampert, 1975 .

Determination of the Sign of Carrier Transported across SiO2 Films on Si

W. C. Johnson, Z. Weinberg, M. Lampert, 1974 .

Hole conduction and valence‐band structure of Si3N4 films on Si

Z. Weinberg, R. Pollak, 1975 .

EXCITON TRANSPORT IN SiO2

G. Rubloff, Z. Weinberg, 1978 .

Photon assisted tunneling from aluminum into silicon dioxide

A. Hartstein, Z. Weinberg, 1976 .

EVIDENCE FOR A BAND TAIL ON THE CONDUCTION BAND EDGE OF THERMAL SiO2 FROM PHOTON ASSISTED TUNNELING MEASUREMENTS

A. Hartstein, Z. Weinberg, D. Dimaria, 1978 .

Positron annihilation studies in the field induced depletion regions of metal‐oxide‐semiconductor structures

T. C. Leung, G. Rubloff, Z. Weinberg, 1992 .

Positron annihilation at the Si/SiO2 interface

T. C. Leung, G. Rubloff, Z. Weinberg, 1992 .

Dislocations and twins formed in zone melted recrystallized Si on SiO2

Z. Weinberg, Y. Komem, 1984 .

Use of photocurrent-voltage characteristics of MOS structures to determine insulator bulk trapped charge densities and centroids

Z. Weinberg, J. Aitken, D. Dimaria, 1977 .

Centroid shift of γ rays from positron annihilation in the depletion region of metal‐oxide‐semiconductor structures

T. C. Leung, G. Rubloff, Z. Weinberg, 1991 .

On tunneling in metal‐oxide‐silicon structures

Z. Weinberg, Z. A. Weinberg, 1982 .

SiO2‐induced substrate current and its relation to positive charge in field‐effect transistors

Massimo V. Fischetti, M. Fischetti, Z. Weinberg, 1986 .

Investigation of the SiO2‐induced substrate current in silicon field‐effect transistors

M. Fischetti, Z. Weinberg, 1985 .

Polysilicon recrystallization by CO2 laser heating of SiO2

Z. Weinberg, 1981 .

Effect of silicon orientation and hydrogen anneal on tunneling from Si into SiO2

A. Hartstein, A. Hartstein, Z. Weinberg, 1983 .

Tunneling of electrons from Si into thermally grown SiO2

Z. Weinberg, Z. A. Weinberg, 1977 .

Investigation of the silicon beading phenomena during zone‐melting recrystallization

Stephan A. Cohen, G. J. Clark, W. Lanford, 1983 .

Location of positive charges in SiO2 films on Si generated by vuv photons, x rays, and high‐field stressing

J. M. Aitken, Z. Weinberg, J. Aitken, 1977 .

Transmission, photoconductivity, and the experimental band gap of thermally grown SiO 2 films

E. Bassous, G. Rubloff, Z. Weinberg, 1979 .

Reduction of electron and hole trapping in SiO2 by rapid thermal annealing

Donald R. Young, Stephan A. Cohen, Vaughn R. Deline, 1984 .

High‐field transport in SiO2 on silicon induced by corona charging of the unmetallized surface

W. C. Johnson, Z. Weinberg, M. Lampert, 1976 .

Experimental test of the quantum-mechanical image-force theory

A. Hartstein, Z. Weinberg, D. Dimaria, 1982 .

The relation between positive charge and breakdown in metal‐oxide‐silicon structures

Z. Weinberg, T. N. Nguyen, Z. A. Weinberg, 1987 .

Ultrathin oxide‐nitride‐oxide films

K. Stein, Z. Weinberg, J. Sun, 1990 .

On the nature of the image force in quantum mechanics with application to photon assisted tunnelling and photoemission

A. Hartstein, Z. Weinberg, 1978 .

Exciton or hydrogen diffusion in SiO2

Donald R. Young, Gary W. Rubloff, G. Rubloff, 1979 .

Exciton transport in SiO2 as a possible cause of surface‐state generation in MOS structures

G. Rubloff, Z. Weinberg, 1978 .

Hole injection and transport in SiO2 films on Si

Z. Weinberg, Z. A. Weinberg, 1975 .

Charge trapping and retention in ultra-thin oxide-nitride-oxide structures

K. Stein, Z. Weinberg, D. Wen, 1991 .