Tieh-Chiang Wu

Impact of gate-induced drain leakage on retention time distribution of 256 Mbit DRAM with negative wordline bias

S. Shih, Minchen Chang, Jengping Lin, 2003 .

Suppression of Row Hammer Effect by Doping Profile Modification in Saddle-Fin Array Devices for Sub-30-nm DRAM Technology

Tieh-Chiang Wu, Chao‐Sung Lai, Chia-Ming Yang, 2016, IEEE Transactions on Device and Materials Reliability.

Scanning Spreading Resistance Microscopy for Doping Profile in Saddle-Fin Devices

Tieh-Chiang Wu, Chao‐Sung Lai, Chia-Ming Yang, 2017, IEEE Transactions on Nanotechnology.