S. Pae
发表
Mark Y. Liu,
M. Bost,
R. Brain,
2008,
2008 IEEE International Electron Devices Meeting.
R. Chau,
C. Auth,
M. Bost,
2007,
2007 IEEE International Electron Devices Meeting.
G. Dewey,
J. Kavalieros,
M. Metz,
2008,
2008 IEEE International Reliability Physics Symposium.
B. Woolery,
S. Pae,
J. Maiz,
2008,
IEEE Transactions on Device and Materials Reliability.
Mark Y. Liu,
C. Parker,
B. Woolery,
2010,
2010 IEEE International Reliability Physics Symposium.
S. Pae,
Kyongtaek Lee,
Hyunwoo Lee,
2014,
2014 IEEE International Reliability Physics Symposium.
S. Pae,
J. Maiz,
C. Prasad,
2007,
2007 IEEE International Integrated Reliability Workshop Final Report.
S. Tyagi,
M. Bohr,
L. Shifren,
2005,
IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest..
S. Pae,
C. Prasad,
S. Ramey,
2005,
2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual..
Sangwoo Pae,
Stephen Ramey,
Jeffrey Hicks,
2009,
2009 IEEE International Reliability Physics Symposium.
A. Murthy,
A. Murthy,
S. Cea,
2002,
Digest. International Electron Devices Meeting,.
S. O. Park,
J. Park,
H. K. Kang,
2019,
2019 IEEE International Electron Devices Meeting (IEDM).
Sangwoo Pae,
Gerold W. Neudeck,
S. Pae,
1999
.
M. Agostinelli,
S. Jacobs,
S. Pae,
2004
.
Hyungcheol Shin,
S. Pae,
H. Shim,
2019,
IEEE Electron Device Letters.
Yung-Huei Lee,
Yin-Lung Ryan Lu,
Sangwoo Pae,
2007,
IEEE Transactions on Device and Materials Reliability.
S. Pae,
J. Yi,
E. Cho,
2020,
Journal of Materials Science: Materials in Electronics.
S. Pae,
Junekyun Park,
H. Sagong,
2020,
2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM).
S. Pae,
Gunrae Kim,
Sangkwon Park,
2017,
2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
S. Pae,
J. Denton,
D. Janes,
1998,
1998 IEEE International SOI Conference Proceedings (Cat No.98CH36199).
S. Pae,
Junekyun Park,
Jaewon Chang,
2018,
2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
S. Pae,
Cheol‐Woong Yang,
Byeong-Seon An,
2019,
Scientific Reports.
J. Jopling,
J. Neirynck,
H. Deshpande,
2009,
2009 IEEE International Electron Devices Meeting (IEDM).
J. S. Yoon,
G. T. Jeong,
G. H. Koh,
2019,
2019 IEEE International Reliability Physics Symposium (IRPS).
Sangwoo Pae,
Jongwoo Park,
In Hak Baick,
2016,
2016 IEEE 66th Electronic Components and Technology Conference (ECTC).
Hoyoung Kang,
Hyun-Chul Sagong,
Junekyun Park,
2018,
2018 IEEE International Reliability Physics Symposium (IRPS).
S. Pae,
Hyoungsub Kim,
Changmin Lee,
2019,
ACS applied materials & interfaces.
Taiki Uemura,
Soonyoung Lee,
Sangwoo Pae,
2018,
IEEE Transactions on Nuclear Science.
Sangwoo Pae,
Jinju Kim,
Junekyun Park,
2019,
2019 IEEE International Reliability Physics Symposium (IRPS).
Hyunjin Kim,
Hyunwoo Lee,
Yoohwan Kim,
2015,
2015 IEEE International Reliability Physics Symposium.
Sangwoo Pae,
Gang-Jun Kim,
Shinhyung Kim,
2021,
2021 IEEE International Reliability Physics Symposium (IRPS).
S. Pae,
S. Lee,
H. Kim,
2021,
2021 IEEE International Electron Devices Meeting (IEDM).
S. Pae,
Y. S. Lee,
S. H. Kim,
2023,
2023 IEEE International Reliability Physics Symposium (IRPS).
S. Pae,
Y. S. Lee,
H. S. Kim,
2023,
2023 IEEE International Reliability Physics Symposium (IRPS).
S. Pae,
S. Lee,
N. Lee,
2022,
2022 IEEE International Reliability Physics Symposium (IRPS).
S. Pae,
Wonchang Kang,
H. Shim,
2019,
IEEE Transactions on Electron Devices.
Hyunjin Kim,
Minjung Jin,
Hyun-Chul Sagong,
2018,
2018 IEEE International Reliability Physics Symposium (IRPS).
Seungjin Choo,
Sangwoo Pae,
Minjung Jin,
2016,
2016 IEEE International Reliability Physics Symposium (IRPS).
H. J. Kim,
J. J. Kim,
S. W. Pae,
2015,
2015 IEEE International Electron Devices Meeting (IEDM).
Taiki Uemura,
Soonyoung Lee,
Sangwoo Pae,
2016,
2016 IEEE International Electron Devices Meeting (IEDM).
S. Pae,
H. Shim,
U. Kwon,
2019,
2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).
Jaewon Chang,
Jinseok Kim,
Ayoung Kim,
2018,
2018 IEEE International Reliability Physics Symposium (IRPS).
T. Jeong,
S. Pae,
H. C. Sagong,
2018,
2018 IEEE Symposium on VLSI Technology.
Seungbae Lee,
Taiki Uemura,
Soonyoung Lee,
2018,
2018 IEEE International Reliability Physics Symposium (IRPS).
Moon Soo Lee,
Seo Hyun Kwon,
S. Pae,
2020,
IEEE Transactions on Device and Materials Reliability.
Moon Soo Lee,
S. Pae,
Jinseok Kim,
2019,
2019 IEEE International Integrated Reliability Workshop (IIRW).
K. Kim,
S. Pae,
J. Kim,
2021,
2021 IEEE International Reliability Physics Symposium (IRPS).
M. Agostinelli,
S. Jacobs,
S. Pae,
2004,
2004 IEEE International Reliability Physics Symposium. Proceedings.
J. Lee,
K. Lee,
Y. J. Song,
2020,
2020 IEEE International Reliability Physics Symposium (IRPS).
Zhanping Chen,
Sangwoo Pae,
W. Hafez,
2012,
2012 Symposium on VLSI Technology (VLSIT).
Yoohwan Kim,
Minjung Jin,
Jinju Kim,
2018,
Microelectron. Reliab..
Sangwoo Pae,
Minjung Jin,
Jin Ju Kim,
2018,
2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
J. Jopling,
C. Prasad,
T. Ghani,
2009,
2009 IEEE International Reliability Physics Symposium.