B. Sell
发表
Mark Y. Liu,
M. Bost,
R. Brain,
2008,
2008 IEEE International Electron Devices Meeting.
P. Moll,
H. Reisinger,
T. Hecht,
2001,
International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224).
P. Bai,
C. Auth,
R. Heussner,
2005,
IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest..
Mark Y. Liu,
M. Bost,
V. Chikarmane,
2014,
2014 IEEE International Electron Devices Meeting.
K. Phoa,
B. Sell,
S. Ravikumar,
2018,
2018 IEEE International Electron Devices Meeting (IEDM).
S. Mudanai,
K. Phoa,
P. Bai,
2017,
2017 IEEE International Electron Devices Meeting (IEDM).
B. Sell,
2002
.
B. Sell,
W. Krautschneider,
A. Sänger,
2003
.
B. Sell,
W. Krautschneider,
A. Sänger,
2003
.
J. Jopling,
J. Neirynck,
H. Deshpande,
2009,
2009 IEEE International Electron Devices Meeting (IEDM).
Dilip Krishnan,
N. Lindert,
J. Sandford,
2022,
2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits).
S. Natarajan,
M. Agostinelli,
C. Tsai,
2013,
2013 IEEE International Reliability Physics Symposium (IRPS).
James Tschanz,
Vivek De,
Han Wui Then,
2021,
2021 Symposium on VLSI Circuits.
M. Armstrong,
B. Sell,
M. Armstrong,
2019,
2019 IEEE International Electron Devices Meeting (IEDM).
C. Wiegand,
O. Golonzka,
U. Arslan,
2019,
2019 IEEE International Electron Devices Meeting (IEDM).