Y. Takita

Closed-Form Expressions for the Maximum Transient Noise Voltage Caused by an IC Switching Current on a Power Distribution Network

L. Li, Jingook Kim, J. Drewniak, 2012, IEEE Transactions on Electromagnetic Compatibility.

Improved target impedance and IC transient current measurement for power distribution network design

Kenji Araki, Jun Fan, Songping Wu, 2010, 2010 IEEE International Symposium on Electromagnetic Compatibility.