Wei-Cheng Lien

发表

Output bit selection for test response compaction based on a single counter

Kuen-Jong Lee, Wei-Cheng Lien, Tong-Yu Hsieh, 2012, 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology.

A Complete Logic BIST Technology with No Storage Requirement

Kuen-Jong Lee, Wei-Cheng Lien, 2010, 2010 19th IEEE Asian Test Symposium.

Output-bit selection with X-avoidance using multiple counters for test-response compaction

Krishnendu Chakrabarty, Kuen-Jong Lee, Wei-Cheng Lien, 2014, 2014 19th IEEE European Test Symposium (ETS).

A Test-Per-Clock LFSR Reseeding Algorithm for Concurrent Reduction on Test Sequence Length and Test Data Volume

Kuen-Jong Lee, Wei-Cheng Lien, Tong-Yu Hsieh, 2012, 2012 IEEE 21st Asian Test Symposium.

Design of a concurrent dual-band receiver front-end in 0.18 /spl mu/m CMOS for WLANs IEEE 802.11a/b/g applications

Wei-Cheng Lien, Kuo-Hua Cheng, C.F. Jou, 2004, The 2004 47th Midwest Symposium on Circuits and Systems, 2004. MWSCAS '04..

Extreme temperature 4H-SiC metal-semiconductor-metal ultraviolet photodetectors

Wei-Cheng Lien, Jr-Hau He, Albert P. Pisano, 2012, 2012 Proceedings of the European Solid-State Device Research Conference (ESSDERC).

An Efficient On-Chip Test Generation Scheme Based on Programmable and Multiple Twisted-Ring Counters

Kuen-Jong Lee, Wei-Cheng Lien, Tong-Yu Hsieh, 2013, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

Efficient LFSR Reseeding Based on Internal-Response Feedback

Krishnendu Chakrabarty, Kuen-Jong Lee, Wei-Cheng Lien, 2014, J. Electron. Test..

A Test-per-cycle BIST architecture with low area overhead and no storage requirement

Kuen-Jong Lee, Wei-Cheng Lien, Chung-Min Shiao, 2016, 2016 International Symposium on VLSI Design, Automation and Test (VLSI-DAT).

Integrated 4H-silicon carbide diode bridge rectifier for high temperature (773 K) environment

Wei-Cheng Lien, Albert P. Pisano, Ayden Maralani, 2014, 2014 44th European Solid State Device Research Conference (ESSDERC).

Routing-efficient implementation of an internal-response-based BIST architecture

Kuen-Jong Lee, Wei-Cheng Lien, Tong-Yu Hsieh, 2012, Proceedings of Technical Program of 2012 VLSI Design, Automation and Test.

Output bit selection methodology for test response compaction

Kuen-Jong Lee, Wei-Cheng Lien, 2016, 2016 IEEE International Test Conference (ITC).

Capture-Power-Safe Test Pattern Determination for At-Speed Scan-Based Testing

Kuen-Jong Lee, Wei-Cheng Lien, Ing-Chao Lin, 2014, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

Accumulator-based output selection for test response compaction

Krishnendu Chakrabarty, Kuen-Jong Lee, Wei-Cheng Lien, 2012, 2012 IEEE International Symposium on Circuits and Systems.

Test Response Compaction via Output Bit Selection

Kuen-Jong Lee, Wei-Cheng Lien, Tong-Yu Hsieh, 2011, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

Counter-Based Output Selection for Test Response Compaction

Krishnendu Chakrabarty, Kuen-Jong Lee, Wei-Cheng Lien, 2013, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

Output selection for test response compaction based on multiple counters

Krishnendu Chakrabarty, Kuen-Jong Lee, Wei-Cheng Lien, 2014, Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test.

A rotation-based BIST with self-feedback logic to achieve complete fault coverage

Kuen-Jong Lee, Wei-Cheng Lien, Tong-Yu Hsieh, 2011, Proceedings of 2011 International Symposium on VLSI Design, Automation and Test.

A New LFSR Reseeding Scheme via Internal Response Feedback

Krishnendu Chakrabarty, Kuen-Jong Lee, Wei-Cheng Lien, 2013, 2013 22nd Asian Test Symposium.

Highly-integrated, quad bands /spl Delta//spl Sigma/ fractional-N frequency synthesizer design in 0.18-/spl mu/m standard CMOS process

Wei-Cheng Lien, Cheng-Hung Chen, C.F. Jou, 2005, 2005 Asia-Pacific Microwave Conference Proceedings.

An efficient diagnosis method to deal with multiple fault-pairs simultaneously using a single circuit model

Kuen-Jong Lee, Wei-Cheng Lien, Cheng-Hung Wu, 2014, 2014 IEEE 32nd VLSI Test Symposium (VTS).

Unveiling of How Image Restoration Contributes to Underwater Object Detection

Wei-Cheng Lien, Yan-Tsung Peng, Chu-Song Chen, 2021, 2021 IEEE International Conference on Consumer Electronics-Taiwan (ICCE-TW).

GROWTH OF HIGHLY C-AXIS ORIENTED ALN FILMS ON 3C-SIC/SI SUBSTRATE

Wei-Cheng Lien, Albert P. Pisano, Debbie G. Senesky, 2010 .

Nanocrystalline SiC metal-semiconductor-metal photodetector with ZnO nanorod arrays for high-temperature applications

Wei-Cheng Lien, Albert P. Pisano, Jr-Hau He, 2011, 2011 16th International Solid-State Sensors, Actuators and Microsystems Conference.

Silicon Carbide Transistors for IC Design Applications up to 600 °C

Wei-Cheng Lien, Albert P. Pisano, Ayden Maralani, 2014 .

SiC Metal – Semiconductor – Metal Ultraviolet Photodetectors in Operation of 450 ◦ C

Wei-Cheng Lien, Albert P. Pisano, Der-Hsien Lien, 2012 .

4H–SiC Metal–Semiconductor–Metal Ultraviolet Photodetectors in Operation of 450 $^{\circ}\hbox{C}$

Wei-Cheng Lien, Der-Hsien Lien, Hau He, 2012, IEEE Electron Device Letters.

AlN thin films grown on epitaxial 3C–SiC (100) for piezoelectric resonant devices

Wei-Cheng Lien, Albert P. Pisano, Debbie G. Senesky, 2010 .

Solar-Blind Photodetectors for Harsh Electronics

Wei-Cheng Lien, Albert P. Pisano, Jr-Hau He, 2013, Scientific Reports.