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SEU response of design- and resistor-hardened D-latches in the SA3300 microprocessor

C. L. Axness, F. W. Sexton, Marty R. Shaneyfelt, 1991 .

Use of COTS microelectronics in radiation environments

Marty R. Shaneyfelt, P. S. Winokur, F. W. Sexton, 1999 .

Radiation hardness assurance categories for COTS technologies

Marty R. Shaneyfelt, P. S. Winokur, F. W. Sexton, 1997, 1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference.

Single-event upset and snapback in silicon-on-insulator devices

P. S. Winokur, G. L. Hash, Paul E. Dodd, 2000 .