Jian Shi

A control approach to cross-coupling compensation of piezotube scanners in tapping-mode atomic force microscope imaging.

Q. Zou, Ying Wu, Jian Shi, 2009, The Review of scientific instruments.

Design and development of an interferometer with improved angular tolerance and its application to x–y theta measurement

C. Menq, Jian Shi, Ji-Hua Zhang, 2000 .

Measurement of modal birefringence in optical waveguides based on the Mach-Zehnder interferometer.

Jian Shi, X. Huang, Qilong Tan, 2014, The Review of scientific instruments.

Motion Controller for Atomic Force Microscopy Based Nanobiomanipulation

Bo Song, Ning Xi, Bingtuan Gao, 2011 .

AFM image based pattern detection for adaptive drift compensation and positioning at the nanometer scale

Chanmin Su, S. Belikov, Jian Shi, 2008, 2008 American Control Conference.