X. Garros
发表
E. Deloffre,
O. Faynot,
T. Skotnicki,
2008
.
A. Toffoli,
J. Cluzel,
O. Faynot,
2010,
2010 Symposium on VLSI Technology.
O. Weber,
C. Fenouillet-Béranger,
P. Perreau,
2010,
2010 International Electron Devices Meeting.
F. Andrieu,
X. Garros,
M. Cassé,
2009
.
C. Leroux,
X. Garros,
G. Reimbold,
2007,
2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual.
F. Andrieu,
X. Garros,
G. Reimbold,
2009,
2009 IEEE International SOI Conference.
O. Weber,
F. Andrieu,
X. Garros,
2012,
2012 IEEE International Reliability Physics Symposium (IRPS).
G. Ghibaudo,
X. Garros,
G. Reimbold,
2013,
IEEE Transactions on Electron Devices.
C-M. V. Lu,
A. Toffoli,
T. Skotnicki,
2017,
2017 Symposium on VLSI Technology.
X. Garros,
O. Faynot,
M. Vinet,
2005,
Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005..
G. Molas,
H. Grampeix,
P. Brianceau,
2007
.
X. Garros,
O. Faynot,
P. Batude,
2010,
2010 Symposium on VLSI Technology.
W. Schwarzenbach,
K. Bourdelle,
F. Andrieu,
2015
.
X. Garros,
G. Reimbold,
C. Fenouillet-Beranger,
2009,
2009 IEEE International Reliability Physics Symposium.
C. Leroux,
G. Ghibaudo,
X. Garros,
2005,
Proceedings of the 12th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2005. IPFA 2005..
G. Molas,
H. Grampeix,
L. Perniola,
2018
.
G. Molas,
A. Toffoli,
H. Grampeix,
2008,
ESSDERC 2008 - 38th European Solid-State Device Research Conference.
O. Weber,
F. Andrieu,
X. Garros,
2011
.
X. Garros,
M. Cassé,
M. Vinet,
2022,
2022 IEEE International Reliability Physics Symposium (IRPS).
C. Leroux,
X. Garros,
G. Reimbold,
2005,
IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest..
P. Thony,
X. Garros,
J. Coignus,
2011
.
Interface states characterization in heterojunction solar cells from CV-GV measurements and modeling
J. Cluzel,
X. Garros,
G. Reimbold,
2011
.
X. Garros,
M. Rafik,
A. Bravaix,
2010,
2010 International Electron Devices Meeting.
X. Garros,
P. Ferrari,
J. Lugo-Alvarez,
2022,
2022 IEEE International Reliability Physics Symposium (IRPS).
G. Ghibaudo,
X. Garros,
X. Federspiel,
2018,
IEEE Transactions on Device and Materials Reliability.
G. Ghibaudo,
X. Garros,
X. Federspiel,
2019,
2018 International Integrated Reliability Workshop (IIRW).
G. Ghibaudo,
X. Garros,
G. Reimbold,
2015
.
X. Garros,
P. Scheiblin,
G. Reimbold,
2013
.
Mikaël Casse,
Sylvain Barraud,
X. Federspiel,
2018,
2018 IEEE International Reliability Physics Symposium (IRPS).
O. Faynot,
G. Ghibaudo,
X. Garros,
2017,
2017 Symposium on VLSI Technology.
X. Garros,
J. Autran,
C. Leroux,
2002
.
Pascal Masson,
Michel Houssa,
Xavier Garros,
2002
.
C. Leroux,
D. Bensahel,
X. Garros,
2009
.
X. Garros,
O. Faynot,
C. Laviron,
2008,
ESSDERC 2008 - 38th European Solid-State Device Research Conference.
X. Garros,
M. Cassé,
J. Mitard,
2004
.
G. Sicard,
C. Fenouillet-Béranger,
F. Andrieu,
2021,
2021 IEEE International Interconnect Technology Conference (IITC).
Maud Vinet,
Mikaël Casse,
Laurent Brunet,
2014,
2014 44th European Solid State Device Research Conference (ESSDERC).
Gilles Reimbold,
Charles Leroux,
Gérard Ghibaudo,
2007,
Microelectron. Reliab..
G. Ghibaudo,
X. Garros,
G. Reimbold,
2006
.
G. Ghibaudo,
X. Garros,
X. Federspiel,
2019,
Microelectronics Reliability.
X. Garros,
V. Knopik,
F. Cacho,
2022,
2022 IEEE International Reliability Physics Symposium (IRPS).
X. Garros,
V. Knopik,
E. Vincent,
2021,
International Electron Devices Meeting.
X. Garros,
J. Cluzel,
F. Cacho,
2019,
2019 IEEE International Electron Devices Meeting (IEDM).
Florian Cacho,
Xavier Garros,
David Roy,
2019,
2019 IEEE International Reliability Physics Symposium (IRPS).
X. Garros,
G. Reimbold,
X. Federspiel,
2017
.
X. Garros,
X. Federspiel,
M. Rafik,
2022,
2022 IEEE International Reliability Physics Symposium (IRPS).
J. Cluzel,
G. Ghibaudo,
X. Garros,
2020,
IEEE Electron Device Letters.
M. Rafik,
X. Federspiel,
Xavier Garros,
2018,
2018 IEEE International Reliability Physics Symposium (IRPS).
X. Garros,
O. Rozeau,
G. Ghibaudo,
2020,
2020 IEEE Symposium on VLSI Technology.
X. Garros,
A. Toffoli,
G. Reimbold,
2014
.
X. Garros,
O. Rozeau,
O. Faynot,
2017,
2017 IEEE International Electron Devices Meeting (IEDM).
M. Mouis,
X. Garros,
P. Batude,
2011,
2011 Proceedings of the European Solid-State Device Research Conference (ESSDERC).
G. Ghibaudo,
M. Mouis,
F. Andrieu,
2009
.
X. Garros,
G. Reimbold,
Emmanuel Augendre,
2009
.
X. Garros,
O. Faynot,
D. Noblet,
2009,
2009 IEEE International Electron Devices Meeting (IEDM).
P. Thony,
X. Garros,
J. Coignus,
2011,
2011 Numerical Simulation of Optoelectronic Devices.
X. Garros,
P. Batude,
S. Deleonibus,
2007
.
M. Rafik,
Gilles Reimbold,
X. Federspiel,
2018,
2018 IEEE International Reliability Physics Symposium (IRPS).
X. Garros,
Laurent Vandroux,
Pascal Besson,
2007
.
Sorin Cristoloveanu,
Gilles Reimbold,
François Andrieu,
2014,
2014 44th European Solid State Device Research Conference (ESSDERC).
C. Leroux,
X. Garros,
J. Damlencourt,
2003
.
C. Fenouillet-Béranger,
F. Andrieu,
X. Garros,
2021,
IEEE Transactions on Electron Devices.
X. Garros,
P. Batude,
L. Brunet,
2021,
IEEE Transactions on Electron Devices.
J. Cluzel,
G. Ghibaudo,
R. Modica,
2020,
2020 IEEE International Electron Devices Meeting (IEDM).
J. Cluzel,
G. Ghibaudo,
R. Modica,
2021,
IEEE Transactions on Electron Devices.
L. Gerrer,
Florian Cacho,
D. Roy,
2021,
2021 IEEE International Reliability Physics Symposium (IRPS).
A. Torres,
Xavier Garros,
F. Gaillard,
2018,
2018 IEEE International Reliability Physics Symposium (IRPS).
X. Garros,
G. Reimbold,
G. Ghibaudo,
2016,
2016 IEEE Symposium on VLSI Technology.
X. Garros,
O. Rozeau,
O. Faynot,
2006,
2009 Symposium on VLSI Technology.
X. Garros,
P. Batude,
M. Vinet,
2014,
2014 IEEE International Electron Devices Meeting.
X. Garros,
C. Leroux,
F. Martin,
2004,
2004 IEEE International Reliability Physics Symposium. Proceedings.
Interface states in HfO/sub 2/ stacks with metal gate: nature, passivation, generation [MOS devices]
X. Garros,
G. Reimbold,
C. Leroux,
2005,
2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual..
X. Garros,
G. Reimbold,
G. Ghibaudo,
2006,
2006 IEEE International Reliability Physics Symposium Proceedings.