V. Székely

发表

M. Rencz, G. Farkas, V. Székely, 2003, Proceedings of the 5th Electronics Packaging Technology Conference (EPTC 2003).

M. Rencz, V. Székely, C. Marta, 1998 .

Vladimír Székely, V. Székely, P. Szabó, 2009 .

V. Székely, P. Szabó, 2008, 2008 Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS.

Marta Rencz, A. Pahi, Vladimir Szekely, 1998 .

M. Rencz, V. Székely, B. Courtois, 1998, Fourteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (Cat. No.98CH36195).

Marta Rencz, Bernard Courtois, Vladimir Szekely, 2004 .

M. Rencz, V. Szekely, A. Poppe, 2004, Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (IEEE Cat. No.04CH37545).

G. Farkas, V. Székely, A. Poppe, 2005, 2005 7th Electronic Packaging Technology Conference.

Márta Rencz, Bernard Courtois, Vladimír Székely, 2000, J. Electron. Test..

Márta Rencz, András Poppe, Vladimír Székely, 2003, 2003 Design, Automation and Test in Europe Conference and Exhibition.

V. Szekely, S. Torok, E. Kollar, 2007, 2007 13th International Workshop on Thermal Investigation of ICs and Systems (THERMINIC).

M. Glesner, M. Rencz, V. Székely, 1997, Proceedings of the 34th Design Automation Conference.

V. Székely, P. Szabó, 2010, 2010 Symposium on Design Test Integration and Packaging of MEMS/MOEMS (DTIP).

P. Fürjes, M. Rencz, V. Székely, 2005 .

Vladimir Szekely, Albin Szalai, V. Székely, 2016 .

Vladimír Székely, Albin Szalai, V. Székely, 2015, Int. J. Circuit Theory Appl..

M. Rencz, V. Szekely, A. Poppe, 2005, IEEE Transactions on Components and Packaging Technologies.

V. Székely, P. Szabó, 2010, Analog Integrated Circuits and Signal Processing.

Péter G. Szabó, Vladimír Székely, V. Székely, 2008, ArXiv.

Vladimir Szekely, P. G. Szabo, V. Székely, 2008 .

Marta Rencz, Vladimir Szekely, M. Rencz, 2002 .

M. Rencz, V. Székely, A. Poppe, 1999 .

Márta Rencz, Vladimír Székely, M. Rencz, 1998, Proceedings Design, Automation and Test in Europe.

Andras Poppe, Marta Rencz, Bernard Courtois, 1996, Photonics West - Micro and Nano Fabricated Electromechanical and Optical Components.

Vladimír Székely, V. Székely, 2002, Microelectron. Reliab..

Marta Rencz, Vladimir Szekely, M. Rencz, 2000 .

M. Rencz, V. Szekely, G. Somlay, 2008, 2008 14th International Workshop on Thermal Inveatigation of ICs and Systems.

M. Rencz, V. Szekely, S. Torok, 2001, IMTC 2001. Proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference. Rediscovering Measurement in the Age of Informatics (Cat. No.01CH 37188).

Marta Rencz, Vladimir Szekely, A. Csendes, 1996 .

Bernard Courtois, Marta Rencz, Vladimir Szekely, 1996 .

Márta Rencz, Vladimír Székely, C. Marta, 1997, IEEE Trans. Very Large Scale Integr. Syst..

Ferenc Ender, Vladimir Szekely, Hunor Santha, 2010, 33rd International Spring Seminar on Electronics Technology, ISSE 2010.

Ferenc Ender, Vladimir Szekely, Hunor Santha, 2009, 2009 32nd International Spring Seminar on Electronics Technology.

M. Rencz, V. Szekely, Yan Zhang, 2006, IEEE Transactions on Components and Packaging Technologies.

M. Rencz, V. Szekely, A. Poppe, 2000, Sixteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (Cat. No.00CH37068).

Marta Rencz, Vladimir Szekely, M. Rencz, 2001 .

M. Rencz, V. Szekely, M. Rencz, 2004, IEEE Transactions on Components and Packaging Technologies.

J.H. Huijsing, V. Szekely, K.A.A. Makinwa, 2002, IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276).

Bernard Courtois, Marta Rencz, Vladimir Szekely, 1997 .

M. Rencz, V. Szekely, B. Courtois, 1996, Proceedings of International Conference on Microelectronic Test Structures.