C. Stapper

发表

The effects of wafer to wafer defect density variations on integrated circuit defect and fault distributions

C. Stapper, 1985 .

Defect density distribution for LSI yield calculations

C. Stapper, 1973 .

Large-Area Fault Clusters and Fault Tolerance in VLSI Circuits: A Review

Charles H. Stapper, C. Stapper, 1989, IBM J. Res. Dev..

Correlation analysis of particle clusters on integrated circuit wafers

C. Stapper, 1987 .

A simple method for modeling VLSI yields

C. H. Stapper, R. J. Rosner, C. Stapper, 1982 .

Micromagnetic Solutions for Ferromagnetic Spheres

Charles H. Stapper, C. Stapper, 1969 .

Integrated circuit yield statistics

C.H. Stapper, F.M. Armstrong, K. Saji, 1983, Proceedings of the IEEE.

Fault-simulation Programs For

C. Stapper, 1989 .

A mathematical model for cooperative diffusion

C. Stapper, D. Withers, W. K. Balcezak, 1973 .

Integrated circuit yield management and yield analysis: development and implementation" ieee trans

C. H. Stapper, R. J. Rosner, C. Stapper, 1995 .

On Murphy's yield integral (IC manufacture)

C. H. Stapper, C. Stapper, 1991 .

On yield, fault distributions, and clustering of particles

C. H. Stapper, C. Stapper, 1986 .

Yield Model for Productivity Optimization of VLSI Memory Chips with Redundancy and Partially Good Product

C. H. Stapper, A. N. McLaren, M. Dreckmann, 1980, IBM J. Res. Dev..

Modeling of Defects in Integrated Circuit Photolithographic Patterns

Charles H. Stapper, C. Stapper, 1984, IBM J. Res. Dev..

Modeling of Integrated Circuit Defect Sensitivities

Charles H. Stapper, C. Stapper, 1983, IBM J. Res. Dev..

Fact and fiction in yield modeling

C. H. Stapper, C. Stapper, 1989 .

A 50-ns 16-Mb DRAM with a 10-ns data rate and on-chip ECC

Howard Leo Kalter, C. H. Stapper, John E. Barth, 1990 .

A 50 ns 16 Mb DRAM with a 10 ns data rate

J. Dilorenzo, H. Kalter, C. Stapper, 1990, 1990 37th IEEE International Conference on Solid-State Circuits.