D. Moyer

Soft error considerations for deep-submicron CMOS circuit applications

N. Cohen, T. Sriram, N. Leland, 1999, International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318).

Frequency dependence of soft error rates for sub-micron CMOS technologies

N. Leland, D. Moyer, L. Massengill, 2001, International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224).

Historical trend in alpha-particle induced soft error rates of the Alpha/sup TM/ microprocessor

R. Hokinson, N. Seifert, D. Moyer, 2001, 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167).