C.S. Wang

A high performance active pixel sensor with 0.18um CMOS color imager technology

S. Wuu, H. Chien, D. Yaung, 2001, International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224).

High performance 0.25-um CMOS color imager technology with non-silicide source/drain pixel

S. Wuu, H. Chien, D. Yaung, 2000, International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138).

An effective method to improve the sensitivity of deep submicrometer CMOS image sensors

C.S. Lin, C.S. Wang, C.Y. Lin, 2005, IEEE Electron Device Letters.

Dramatic reduction of optical crosstalk in deep-submicrometer CMOS imager with air gap guard ring

C.S. Lin, C.S. Wang, C.Y. Lin, 2004, IEEE Electron Device Letters.

Light guide for pixel crosstalk improvement in deep submicron CMOS image sensor

C.S. Lin, C.S. Wang, C.Y. Lin, 2004, IEEE Electron Device Letters.

Air-gap guard ring for pixel sensitivity and crosstalk improvement in deep sub-micron CMOS image sensor

Dun-Nian Yaung, Chien-Hsien Tseng, C.S. Wang, 2003, IEEE International Electron Devices Meeting 2003.

Performance evaluation of field-enhanced P-channel split-gate flash memory

Yu-Hsiung Wang, Wen-Ting Chu, Yung-Tao Lin, 2005, IEEE Electron Device Letters.

DC Characteristics of AlGaAs/GaAs/GaN HBTs Formed by Direct Wafer Fusion

C.S. Wang, H. Xing, L. McCarthy, 2007, IEEE Electron Device Letters.

The mechanism and evaluation of hot-carrier-induced performance degradation in 0.18-/spl mu/m CMOS image sensor

S. Wuu, H. Chien, D. Yaung, 2004, IEEE Electron Device Letters.