Z. Khatir
发表
Stéphane Lefebvre,
Zoubir Khatir,
L. Dupont,
2007,
Microelectron. Reliab..
S. Lefebvre,
A. Bouzourene,
Z. Khatir,
2013,
2013 15th European Conference on Power Electronics and Applications (EPE).
L. Dupont,
Z. Khatir,
S. Lefebvre,
2007,
2007 European Conference on Power Electronics and Applications.
Stéphane Lefebvre,
Zoubir Khatir,
S. Bontemps,
2009,
Microelectron. Reliab..
L. Dupont,
Y. Avenas,
P. Jeannin,
2016,
IEEE Transactions on Components, Packaging and Manufacturing Technology.
L. Dupont,
Y. Avenas,
P. Jeannin,
2013,
2013 15th European Conference on Power Electronics and Applications (EPE).
Stéphane Lefebvre,
Zoubir Khatir,
L. Dupont,
2006,
Microelectron. Reliab..
L. Dupont,
Z. Khatir,
S. Tran,
2017,
2017 19th European Conference on Power Electronics and Applications (EPE'17 ECCE Europe).
Z. Khatir,
D. Sebille,
Ph. Larguier,
1996
.
Z. Khatir,
T. Hamieh,
A. Ibrahim,
2019,
Scientific Reports.
Z. Khatir,
T. Hamieh,
A. Ibrahim,
2018,
Nanoscience & Technology: Open Access.
Z. Khatir,
T. Lebey,
Vh Nguyen,
2009,
2009 13th European Conference on Power Electronics and Applications.
Wire-bond contact degradation modeling for remaining useful lifetime prognosis of IGBT power modules
Z. Khatir,
N. Degrenne,
A. Ibrahim,
2020
.
Z. Khatir,
M. Berkani,
A. Ibrahim,
2022,
Microelectronics Reliability.
Z. Khatir,
N. Degrenne,
M. Berkani,
2022,
Computational Mechanics.
Merouane Ouhab,
Zoubir Khatir,
Ali Ibrahim,
2018,
IEEE Transactions on Power Electronics.
L. Dupont,
Z. Khatir,
S. Lefebvre,
2005,
2005 European Conference on Power Electronics and Applications.
L. Dupont,
Z. Khatir,
S. Lefebvre,
2005
.
Z. Khatir,
J. Ousten,
Zoubir Khatir,
2011,
2011 27th Annual IEEE Semiconductor Thermal Measurement and Management Symposium.
Daniel Hissel,
Arnaud Gaillard,
Zoubir Khatir,
2015
.
Alexandre De Bernardinis,
Ahmad Jammal,
Khaled Itani,
2017
.
L. Dupont,
Z. Khatir,
Y. Avenas,
2012,
IEEE Transactions on Power Electronics.
Mounira Berkani,
Stéphane Lefebvre,
Frédéric Richardeau,
2011,
IEEE Transactions on Industrial Electronics.
Zoubir Khatir,
Alexandre De Bernardinis,
Ahmad Jammal,
2016
.
Z. Khatir,
N. Degrenne,
A. Ibrahim,
2020
.
Stéphane Lefebvre,
Zoubir Khatir,
Z. Khatir,
2004,
Microelectron. Reliab..
Stéphane Lefebvre,
Zoubir Khatir,
D. Othman,
2012,
Microelectron. Reliab..
Zoubir Khatir,
Alexandre De Bernardinis,
Ahmad Jammal,
2016,
IECON 2016 - 42nd Annual Conference of the IEEE Industrial Electronics Society.
Zoubir Khatir,
Richard Lallemand,
A. Ibrahim,
2016,
Microelectron. Reliab..
Mounira Berkani,
Stéphane Lefebvre,
Zoubir Khatir,
2013,
Microelectron. Reliab..
Z. Khatir,
M. Berkani,
A. Ibrahim,
2022,
Microelectronics Reliability.
Jeffrey Ewanchuk,
Stefan V. Mollov,
Zoubir Khatir,
2019,
IEEE Journal of Emerging and Selected Topics in Power Electronics.
Zoubir Khatir,
Alexandre De Bernardinis,
Mohamad Oueidat,
2016,
IEEE Transactions on Transportation Electrification.
Zoubir Khatir,
Stéphane Lefebvre,
Laurent Dupont,
2003
.
Z. Khatir,
T. Hamieh,
A. Ibrahim,
2019,
Scientific Reports.
Stéphane Lefebvre,
Zoubir Khatir,
F. Saint-Eve,
2007,
Microelectron. Reliab..
Z. Khatir,
A. Ibrahim,
R. Escoffier,
2018
.
Laurent Dupont,
Zoubir Khatir,
Son Ha Tran,
2017,
IEEE Transactions on Components, Packaging and Manufacturing Technology.
Z. Khatir,
A. Ibrahim,
P. Pichón,
2022,
Journal of Electronic Materials.
Z. Khatir,
M. Bouarroudj,
S. Lefebvre,
2008,
IEEE Transactions on Device and Materials Reliability.
Jeffrey Ewanchuk,
Stefan V. Mollov,
Zoubir Khatir,
2019,
IEEE Transactions on Power Electronics.
Z. Khatir,
R. Lallemand,
A. Ibrahim,
2023,
Microelectronics Reliability.
Jeffrey Ewanchuk,
Ali Ibrahim,
Zoubir Khatir,
2018,
Microelectron. Reliab..
Power Cycling Tests in High Temperature Conditions of SiC-MOSFET Power Modules and Ageing Assessment
Zoubir Khatir,
Richard Lallemand,
J. P. Ousten,
2016
.
Dispersion of Electrical Characteristics and Short-Circuit Robustness of 600 V Emode GaN Transistors
Zoubir Khatir,
Denis Labrousse,
Matthieu Landel,
2017
.