J. Ousten
发表
Stéphane Lefebvre,
Zoubir Khatir,
L. Dupont,
2007,
Microelectron. Reliab..
Merouane Ouhab,
Zoubir Khatir,
Ali Ibrahim,
2018,
IEEE Transactions on Power Electronics.
Z. Khatir,
J. Ousten,
Zoubir Khatir,
2011,
2011 27th Annual IEEE Semiconductor Thermal Measurement and Management Symposium.
Jeffrey Ewanchuk,
Stefan V. Mollov,
Zoubir Khatir,
2019,
IEEE Journal of Emerging and Selected Topics in Power Electronics.
Z. Khatir,
M. Bouarroudj,
S. Lefebvre,
2008,
IEEE Transactions on Device and Materials Reliability.
Jeffrey Ewanchuk,
Stefan V. Mollov,
Zoubir Khatir,
2019,
IEEE Transactions on Power Electronics.
Power Cycling Tests in High Temperature Conditions of SiC-MOSFET Power Modules and Ageing Assessment
Zoubir Khatir,
Richard Lallemand,
J. P. Ousten,
2016
.
Zoubir Khatir,
Richard Lallemand,
A. Ibrahim,
2016,
Microelectron. Reliab..