E. Wu
发表
Stephan A. Cohen,
A. Vayshenker,
R. Wachnik,
2000,
2000 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.00CH37104).
E. Nowak,
W. Abadeer,
E. Wu,
1999,
International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318).
J. Stathis,
E. Wu,
Baozhen Li,
2014,
2014 IEEE International Reliability Physics Symposium.
E. Nowak,
E. Wu,
L. Han,
2000
.
Ernest Y. Wu,
Jordi Sune,
E. Wu,
2009,
2009 IEEE International Reliability Physics Symposium.
Jordi Suñé,
Ernest Y. Wu,
E. Wu,
2002
.
E. Wu,
B. Yu,
1991
.
E. Wu,
B. Yu,
1991
.
J. Stathis,
E. Wu,
Liang-Kai Han,
2000
.
W. Abadeer,
E. Nowak,
J. Aitken,
1998,
International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217).
Jordi Suñé,
Ernest Y. Wu,
Timothy D. Sullivan,
2009
.
E. Cartier,
V. Narayanan,
R. Muralidhar,
2020
.
J. Stathis,
E. Wu,
T. Ando,
2020,
Japanese Journal of Applied Physics.
Jordi Suñé,
Ernest Y. Wu,
E. Wu,
2002
.
E. Nowak,
E. Wu,
W. Lai,
2004,
2004 IEEE International Reliability Physics Symposium. Proceedings.
Ernest Y. Wu,
Durgamadhab Misra,
E. Wu,
2011,
2011 International Reliability Physics Symposium.
E. Wu,
J. Suñé,
W. Lai,
2004
.
E. Wu,
J. Suñé,
2006,
2006 IEEE International Reliability Physics Symposium Proceedings.
E. Wu,
R. J. Friauf,
1990
.
E. Wu,
J. Suñé,
2013,
2013 IEEE International Integrated Reliability Workshop Final Report.
E. Wu,
J. Su,
2008
.
Jordi Suñé,
Ernest Y. Wu,
E. Wu,
2001
.
S. Crowder,
L. Su,
E. Crabbe,
1997,
International Electron Devices Meeting. IEDM Technical Digest.
E. Wu,
Baozhen Li,
2022,
Journal of Applied Physics.
B. Li,
E. Wu,
P. McLaughlin,
2016,
2016 IEEE International Reliability Physics Symposium (IRPS).
M. Khare,
D. Badami,
T. Hook,
2000,
International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138).
J. Stathis,
E. Wu,
S. Lombardo,
2017
.
E. Wu,
R. Bolam,
Baozhen Li,
2022,
2022 IEEE International Reliability Physics Symposium (IRPS).
E. Wu,
Baozhen Li,
2022,
2022 IEEE International Reliability Physics Symposium (IRPS).
J. Stathis,
E. Wu,
R. Bolam,
2016,
2016 IEEE International Reliability Physics Symposium (IRPS).
E. Wu,
D. Ioannou,
C. LaRow,
2011,
2011 International Electron Devices Meeting.
J. Stathis,
E. Wu,
S. Lombardo,
2016,
2016 IEEE International Electron Devices Meeting (IEDM).
E. Wu,
T. Armstrong,
R. J. Friauf,
1991
.
E. Wu,
1990
.
Nagarajan Raghavan,
Jordi Suñé,
H.-S. Philip Wong,
2018,
Advanced Electronic Materials.
Geoffrey W. Burr,
Paul M. Solomon,
Tayfun Gokmen,
2019,
2019 IEEE International Reliability Physics Symposium (IRPS).
Meiyun Zhang,
Feng Miao,
Shibing Long,
2016
.
Ernest Y. Wu,
E. Wu,
R. Vollertsen,
2002
.
Jordi Suñé,
Ernest Y. Wu,
E. Wu,
2005,
Microelectron. Reliab..
E. Y. Wu,
E. Wu,
2013,
2013 IEEE International Reliability Physics Symposium (IRPS).
E. Nowak,
E. Nowak,
E. Wu,
2004,
IEEE Electron Device Letters.
Ernest Y. Wu,
E. Wu,
2019,
IEEE Transactions on Electron Devices.
T. Sullivan,
E. Wu,
R. Vollertsen,
2009
.
T. Sullivan,
E. Wu,
R. Vollertsen,
2009
.
Jordi Suñé,
Ernest Y. Wu,
Edward J. Nowak,
2002
.
R. Bolam,
M. Khare,
J. Sune,
2002,
2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320).
Ernest Y. Wu,
E. Wu,
2019,
IEEE Transactions on Electron Devices.
Baozhen Li,
Ernest Wu,
Paul McLaughlin,
2014,
IEEE International Interconnect Technology Conference.
James H. Stathis,
Ernest Y. Wu,
Baozhen Li,
2013
.
Edward J. Nowak,
Ernest Y. Wu,
Wing L. Lai,
2002,
IBM J. Res. Dev..
Y. Taur,
D. A. Buchanan,
Y. Taur,
1997
.
Jordi Suñé,
Ernest Y. Wu,
E. Wu,
2013
.
Ernest Y. Wu,
Edward J. Nowak,
A. Vayshenker,
2001
.
J. Sune,
E. Wu,
J. Suñé,
2002,
Digest. International Electron Devices Meeting,.
J. Sune,
E. Wu,
J. Suñé,
2001,
2001 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.01 CH37184).
J. Sune,
E. Wu,
J. Suñé,
2002,
IEEE Electron Device Letters.
Rolf-Peter Vollertsen,
E. Y. Wu,
E. Wu,
2004,
Microelectron. Reliab..
E. Wu,
T. Ando,
P. Jamison,
2023,
Advanced Electronic Materials.
E. Wu,
P. Song,
F. Stellari,
2023,
Microelectronics Reliability.
E. Wu,
P. Song,
T. Ando,
2022,
ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC).
E. Wu,
P. Song,
T. Ando,
2022,
2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
E. Wu,
P. Song,
T. Ando,
2022,
Applied Physics Letters.
E. Wu,
P. Song,
T. Ando,
2021,
2021 IEEE International Electron Devices Meeting (IEDM).
C. Cabral,
E. Cartier,
E. Wu,
2021,
IEEE Electron Device Letters.
E. Wu,
P. Song,
T. Ando,
2021,
ISTFA 2021: Conference Proceedings from the 47th International Symposium for Testing and Failure Analysis.
Wen Liu,
Roger Dufresne,
Dinesh Badami,
2016,
2016 IEEE International Reliability Physics Symposium (IRPS).
Ernest Y. Wu,
Jordi Sune,
E. Wu,
2009,
2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.
E.Y. Wu,
J. Sune,
E. Wu,
2009,
IEEE Transactions on Electron Devices.
Miaomiao Wang,
Richard G. Southwick,
Ruqiang Bao,
2021,
2021 IEEE International Reliability Physics Symposium (IRPS).
R. G. Southwick,
J. Stathis,
E. Wu,
2017,
2017 IEEE International Reliability Physics Symposium (IRPS).
Jordi Suñé,
Edward J. Nowak,
Ernest Y. Wu,
2003,
Microelectron. Reliab..
R. G. Southwick,
T. Yamashita,
J. Stathis,
2014,
2014 IEEE International Reliability Physics Symposium.