W. Guo

发表

G. Beyer, E. Beyne, A. Thean, 2014, 2014 IEEE International Electron Devices Meeting.

G. Beyer, E. Beyne, A. Redolfi, 2013, 2013 IEEE International Electron Devices Meeting.

E. Beyne, J. Raskin, V. Moroz, 2015, 2015 IEEE 65th Electronic Components and Technology Conference (ECTC).

G. Beyer, E. Beyne, A. Thean, 2012, 2012 International Electron Devices Meeting.

G. Beyer, E. Beyne, J. de Vos, 2014, 2014 IEEE 64th Electronic Components and Technology Conference (ECTC).

J. Van Houdt, W. Vandervorst, K. De Meyer, 2016, 2016 IEEE Symposium on VLSI Technology.

N. Collaert, C. Merckling, N. Waldron, 2014, 2014 IEEE International Reliability Physics Symposium.

J. Lisoni, W. Guo, K. De Meyer, 2017, IEEE Transactions on Electron Devices.

S. Decoutere, D. Wellekens, B. Bakeroot, 2019, 2019 IEEE International Electron Devices Meeting (IEDM).

C. Merckling, D. Lin, N. Waldron, 2014, 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers.