M. Stucchi
发表
W. Dehaene,
M. Stucchi,
D. Perry,
2010,
2010 International Conference on Microelectronic Test Structures (ICMTS).
G. Beyer,
E. Beyne,
S. Van Huylenbroeck,
2016,
2016 IEEE 66th Electronic Components and Technology Conference (ECTC).
A. Jourdain,
M. Stucchi,
C. Huyghebaert,
2010,
2010 Proceedings 60th Electronic Components and Technology Conference (ECTC).
O. O. Okudur,
Andy Miller,
G. Beyer,
2017,
2017 IEEE International Electron Devices Meeting (IEDM).
Joris Van Campenhout,
Stefan Cosemans,
Gerald Beyer,
2013
.
A. Papanikolaou,
F. Catthoor,
K. Croes,
2008,
IEEE Transactions on Device and Materials Reliability.
A. Jourdain,
E. Beyne,
B. Parvais,
2008,
2008 IEEE International Electron Devices Meeting.
W. Dehaene,
D. Velenis,
M. Stucchi,
2012,
IEEE Transactions on Semiconductor Manufacturing.
W. Dehaene,
M. Stucchi,
G. Katti,
2010,
IEEE Electron Device Letters.
A. Jourdain,
E. Beyne,
A. Mercha,
2010,
2010 IEEE International Interconnect Technology Conference.
G. Beyer,
M. Stucchi,
P. Roussel,
2013
.
G. Beyer,
M. Stucchi,
P. Roussel,
2011,
2011 IEEE International Interconnect Technology Conference.
K. Maex,
M. Stucchi,
S. Vandenberghe,
2001,
2001 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems. Digest of Papers (IEEE Cat. No.01EX496).
K. Maex,
M. Stucchi,
B. Nauwelaers,
2002
.
K. Maex,
M. Stucchi,
S. Vandenberghe,
2002
.
S. Vandenberghe,
D. Schreurs,
B. Nauwelaers,
2002,
IEEE Electron Device Letters.
K. Maex,
M. Stucchi,
S. Vandenberghe,
2001
.
S. Demuynck,
M. Stucchi,
Z. Tokei,
2012,
2012 IEEE International Interconnect Technology Conference.
S. Demuynck,
G. Groeseneken,
M. Stucchi,
2011,
IEEE Transactions on Device and Materials Reliability.
H. Bender,
A. Lauwers,
M. Potter,
1999
.
E. Sleeckx,
M. V. Hove,
K. Maex,
2003
.
E. Beyne,
S. Van Huylenbroeck,
K. Croes,
2017,
IEEE Transactions on Device and Materials Reliability.
E. Beyne,
K. Croes,
M. Stucchi,
2021,
IEEE Transactions on Components, Packaging and Manufacturing Technology.
E. Beyne,
J. de Vos,
S. Van Huylenbroeck,
2020,
IEEE Transactions on Components, Packaging and Manufacturing Technology.
K. Maex,
M. Stucchi,
B. Nauwelaers,
2001
.
Karen Maex,
Herbert Struyf,
Michele Stucchi,
2004
.
S. Demuynck,
E. Van Besien,
L. Zhang,
2012,
2012 IEEE International Interconnect Technology Conference.
G. Beyer,
H. Bender,
F. Iacopi,
2003
.
G. Beyer,
K. Maex,
M. Stucchi,
1999,
Proceedings of the IEEE 1999 International Interconnect Technology Conference (Cat. No.99EX247).
G. Beyer,
K. Maex,
M. Stucchi,
2001
.
K. Croes,
C.J. Wilson,
M. Stucchi,
2018,
2018 IEEE International Electron Devices Meeting (IEDM).
Christopher J. Wilson,
Michele Stucchi,
Zsolt Tokei,
2020,
2020 IEEE International Reliability Physics Symposium (IRPS).
M. Stucchi,
E. Zanoni,
F. Corsi,
1989
.
E. Beyne,
G. Van der Plas,
I. De Wolf,
2012,
2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.
K. Croes,
M. Stucchi,
V. Cherman,
2019,
2019 IEEE International Reliability Physics Symposium (IRPS).
E. Beyne,
K. Croes,
M. Stucchi,
2020,
2020 IEEE 70th Electronic Components and Technology Conference (ECTC).
W. Dehaene,
M. Stucchi,
K. De Meyer,
2010,
IEEE Transactions on Electron Devices.
M. Vanzi,
M. Stucchi,
E. Zanoni,
1989
.
E. Beyne,
J. Raskin,
P. Absil,
2015,
2015 IEEE MTT-S International Microwave Symposium.
Andy Miller,
G. Beyer,
E. Beyne,
2019,
2019 IEEE 69th Electronic Components and Technology Conference (ECTC).
Luca Benini,
Federico Angiolini,
Paresh Limaye,
2010,
IEEE Journal of Solid-State Circuits.
A. Mercha,
D. Verkest,
M. Badaroglu,
2012,
International Electron Devices Meeting.
Karen Maex,
Michele Stucchi,
Olivier Richard,
2004
.
Eric Beyne,
Ingrid De Wolf,
Chen Wu,
2014,
Microelectron. Reliab..
M. Stucchi,
I. Ciofi,
J. Versluijs,
2009,
2009 IEEE International Interconnect Technology Conference.
Geert Vandenberghe,
H.-S. Philip Wong,
Wim Dehaene,
2016
.
E. Beyne,
W. Dehaene,
D. Velenis,
2011
.
E. Beyne,
W. Dehaene,
D. Velenis,
2011,
IEEE Electron Device Letters.
A. Jourdain,
Andy Miller,
G. Beyer,
2020,
2020 IEEE 70th Electronic Components and Technology Conference (ECTC).
M. Van Hove,
K. Maex,
M. Stucchi,
2007,
IEEE Transactions on Semiconductor Manufacturing.
M. Van Hove,
K. Maex,
M. Stucchi,
2006,
2006 International Interconnect Technology Conference.
B. Sorée,
W. Dehaene,
D. Velenis,
2011,
IEEE Electron Device Letters.
Eric Beyne,
Wim Dehaene,
Anne Jourdain,
2009,
2009 IEEE International Conference on 3D System Integration.
Eric Beyne,
Erik Jan Marinissen,
Dimitrios Velenis,
2009,
2009 IEEE International Conference on 3D System Integration.
Karen Maex,
Michele Stucchi,
Mandeep Bamal,
2006
.
Geert Vandenberghe,
H.-S. Philip Wong,
Wim Dehaene,
2016,
SPIE Advanced Lithography.
G. Beyer,
E. Beyne,
K. Croes,
2017
.
K. Maex,
M. Stucchi,
R. Donaton,
2000
.
Gerald Beyer,
Michele Stucchi,
M. Van Hove,
2006
.
M. Van Hove,
S. Demuynck,
K. Maex,
2003,
Proceedings of the IEEE 2003 International Interconnect Technology Conference (Cat. No.03TH8695).
A. Lauwers,
M. Potter,
K. Maex,
1998
.
W. Dehaene,
K. Maex,
E. Grossar,
2006,
IEEE Journal of Solid-State Circuits.
Eric Beyne,
Wei Guo,
Ingrid De Wolf,
2016,
IEEE Design & Test.
A. Jourdain,
G. Beyer,
E. Beyne,
2022,
2022 IEEE 72nd Electronic Components and Technology Conference (ECTC).
A. Jourdain,
G. Beyer,
E. Beyne,
2022,
IEEE Transactions on Electron Devices.
A. Jourdain,
E. Beyne,
A. Veloso,
2021,
2021 IEEE International Electron Devices Meeting (IEDM).
A. Jourdain,
G. Beyer,
E. Beyne,
2022,
2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits).
A. Jourdain,
E. Beyne,
A. Veloso,
2022,
2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits).
E. Beyne,
G. Van der Plas,
V. Cherman,
2011,
2011 IEEE 61st Electronic Components and Technology Conference (ECTC).
E. Beyne,
V. Cherman,
M. Stucchi,
2010,
3rd Electronics System Integration Technology Conference ESTC.
E. Beyne,
J. Ryckaert,
M. Stucchi,
2020,
2020 IEEE International Electron Devices Meeting (IEDM).
S. Kubicek,
M. Stucchi,
E. Marinissen,
2023,
IEEE European Test Symposium.
Eric Beyne,
Yunlong Li,
Geert Van der Plas,
2018,
2018 IEEE International Reliability Physics Symposium (IRPS).
W. Dehaene,
K. Maex,
F. Catthoor,
2005,
2005 International Conference on Integrated Circuit Design and Technology, 2005. ICICDT 2005..
Geert Vandenberghe,
Wim Dehaene,
Julien Ryckaert,
2016
.
Wim Dehaene,
Karen Maex,
Michele Stucchi,
2006,
7th International Symposium on Quality Electronic Design (ISQED'06).
M. Stucchi,
C. Canali,
E. Zanoni,
1989
.
M. Madheswaran,
G. Boopathi Raja,
T. P. Haraszti,
2013
.
Eric Beyne,
Ingrid De Wolf,
Mario Gonzalez,
2017,
Microelectron. Reliab..
Paresh Limaye,
Bart Vandevelde,
Eric Beyne,
2010,
2010 IEEE International Solid-State Circuits Conference - (ISSCC).
Ferenc Fodor,
Erik Jan Marinissen,
Michele Stucchi,
2020,
2020 IEEE European Test Symposium (ETS).