H. Kamineni

New interferometric measurement technique for small diameter TSV

R. Alapati, S. Thangaraju, Daniel Smith, 2014, 25th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC 2014).

Challenges to via middle TSV integration at sub-28nm nodes

R. Alapati, S. Thangaraju, Daniel Smith, 2014, IEEE International Interconnect Technology Conference.

Optical and structural characterization of thermal oxidation effects of erbium thin films deposited by electron beam on silicon

A. Kaloyeros, H. Kamineni, A. Diebold, 2012 .

Study of the effects of structural properties on the photoluminescence behavior of erbium thin films

Mengbing Huang, Alain E. Kaloyeros, Spyros Gallis, 2012, Other Conferences.