Y. Hsia

ADAPTIVE WAFER SCALE INTEGRATION

Y. Hsia, G. Chang, F. Erwin, 1979 .

Cross-gate MNOS memory device

Y. Hsia, 1978 .

Empirical study of the metal‐nitride‐oxide‐semiconductor device characteristics deduced from a microscopic model of memory traps

Y. Hsia, K. Ngai, 1982 .

MNOS Traps and Tailored Trap Distribution Gate Dielectric MNOS

Y. Hsia, K. Ngai, 1979 .

DOPANT DEPENDENCY OF FERMI LEVEL LOCATION IN HEAVILY DOPED SILICON

Y. Hsia, T. Tao, 1968 .