L. Lantz

Impact of pre-conditioning, voltage bias and temperature on reliability of plastic encapsulated microcircuits

M. Pecht, P. Sharma, K. Upadhyayula, 1998 .

Soft errors induced by alpha particles

Leon Lantz, L. Lantz, 1996, IEEE Trans. Reliab..

Ion transport in encapsulants used in microcircuit packaging

M. Pecht, L. Lantz, 2003 .

The Measurement of Ion Diffusion in Epoxy Molding Compounds by Dynamic Secondary Ion Mass Spectroscopy

M. Pecht, L. Lantz, M. Wood, 2008, IEEE Transactions on Components and Packaging Technologies.