H. Shim
发表
M. Choe,
Kyongtaek Lee,
Wonchang Kang,
2013,
2013 IEEE International Reliability Physics Symposium (IRPS).
Hyungcheol Shin,
S. Pae,
H. Shim,
2019,
IEEE Electron Device Letters.
H. Shim,
T. Uemura,
Ken Machida,
2022,
2022 IEEE International Reliability Physics Symposium (IRPS).
H. Shim,
T. Uemura,
Ken Machida,
2022,
2022 IEEE International Reliability Physics Symposium (IRPS).
H. Shim,
Junekyun Park,
H. Sagong,
2020,
2020 IEEE International Electron Devices Meeting (IEDM).
S. Pae,
Wonchang Kang,
H. Shim,
2019,
IEEE Transactions on Electron Devices.
Seungjin Choo,
Sangwoo Pae,
Minjung Jin,
2016,
2016 IEEE International Reliability Physics Symposium (IRPS).
H. J. Kim,
J. J. Kim,
S. W. Pae,
2015,
2015 IEEE International Electron Devices Meeting (IEDM).
Taiki Uemura,
Soonyoung Lee,
Sangwoo Pae,
2016,
2016 IEEE International Electron Devices Meeting (IEDM).
S. Pae,
H. Shim,
U. Kwon,
2019,
2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).
T. Jeong,
S. Pae,
H. C. Sagong,
2018,
2018 IEEE Symposium on VLSI Technology.
Yoohwan Kim,
Minjung Jin,
Jinju Kim,
2018,
Microelectron. Reliab..