Kenneth M. Wallquist

Achieving I/sub DDQ/I/sub SSQ/ production testing with QuiC-

Kenneth M. Wallquist, 1995, IEEE Design & Test of Computers.

A general purpose I/sub DDQ/ measurement circuit

Kenneth M. Wallquist, Charles F. Hawkins, Alan W. Righter, 1993, Proceedings of IEEE International Test Conference - (ITC).

A General Purpose IDDQ Measurement Circuit

Kenneth M. Wallquist, Alan W. Righter, Charles F. Hawkins, 1993 .

On the effect of I/sub SSQ/ testing in reducing early failure rate

Kenneth M. Wallquist, 1995, Proceedings of 1995 IEEE International Test Conference (ITC).

Instrumentation for I DDQ Measurement

Kenneth M. Wallquist, 1997 .

Ac h ievi ng I DDa/ I SSQ Production Testing with QuiC-Mon

Kenneth M. Wallquist, 1995 .

A General Purpose ZDDp Measurement Circuit

Kenneth M. Wallquist, Charles F. Hawkins, Alan W. Righter, 1993 .