D. Moy
发表
Y. Taur,
K. Petrillo,
B. Davari,
1988,
Technical Digest., International Electron Devices Meeting.
Y. Taur,
K. Petrillo,
J. Sun,
1992
.
Yuan Taur,
Chung-Yu Ting,
J. Sun,
1987,
IEEE Transactions on Electron Devices.
J. Warnock,
S. Furkay,
D. Moy,
1993,
Symposium 1993 on VLSI Technology.
M. Sherony,
G. Biery,
T.-C. Chen,
1999,
International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318).
C. Hu,
D. Moy,
D. Pearson,
1989,
Proceedings., Sixth International IEEE VLSI Multilevel Interconnection Conference.
R. Joshi,
D. Moy,
P. Restle,
1989
.
D. Moy,
D. Ackerman,
W. Lawless,
1981
.
D. Moy,
J. Harper,
S. Motakef,
1992
.
D. Moy,
J. Harper,
S. Gong,
1989
.
D. Moy,
A. Anderson,
R. C. Potter,
1983
.
D. Moy,
A. Anderson,
1983
.
R. Katz,
F. Khan,
D. Moy,
2019,
2019 Symposium on VLSI Technology.
Ming Yin,
Balaji Jayaraman,
Subramanian S. Iyer,
2018,
IEEE Journal of Solid-State Circuits.
X. Chen,
Subramanian S. Iyer,
Toshiaki Kirihata,
2015,
2015 IEEE International Reliability Physics Symposium.
Effects of processing conditions on the characteristics of platinum silicide Schottky barrier diodes
G. P. Li,
C. Chuang,
D. Moy,
1988
.
Yuan Taur,
Keith A. Jenkins,
P. J. Coane,
1993,
Proceedings of IEEE International Electron Devices Meeting.
J. Woo,
T. Kirihata,
D. Moy,
2019,
IEEE Electron Device Letters.
Xiang Chen,
Subramanian S. Iyer,
Toshiaki Kirihata,
2007,
2007 IEEE Custom Integrated Circuits Conference.
K. Nummy,
D. Moy,
N. Robson,
2023,
Optical Fiber Communications Conference and Exhibition.
C. Tian,
C. Kothandaraman,
J. Safran,
2007,
IEEE Transactions on Device and Materials Reliability.