T. Nigam
发表
T. Nigam,
B. Parameshwaran,
S. Balasubramanian,
2014,
Proceedings of the IEEE 2014 Custom Integrated Circuits Conference.
G. Groeseneken,
H. Maes,
T. Nigam,
1999,
1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual (Cat. No.99CH36296).
R. Ranjan,
M. Natarajan,
B. Parameshwaran,
2017,
2017 IEEE Electron Devices Technology and Manufacturing Conference (EDTM).
D. Muller,
J. Grazul,
P. Kalavade,
2001
.
M. Heyns,
T. Nigam,
M. Depas,
1996
.
Guido Groeseneken,
Tanya Nigam,
Robin Degraeve,
1999
.
Y. Liu,
T. Nigam,
S. Uppal,
2013,
2013 IEEE International Reliability Physics Symposium (IRPS).
Guido Groeseneken,
Felice Crupi,
Tanya Nigam,
1998
.
T. Nigam,
P. Gammel,
Shuming Xu,
2003,
ISPSD '03. 2003 IEEE 15th International Symposium on Power Semiconductor Devices and ICs, 2003. Proceedings..
T. Nigam,
A. Kornblit,
F. P. Klemens,
2002
.
T. Nigam,
M. Toledano-Luque,
P. Srinivasan,
2019,
2019 IEEE International Reliability Physics Symposium (IRPS).
A. Kerber,
T. Nigam,
2019,
Microelectronics Reliability.
A. Kerber,
T. Nigam,
P. Srinivasan,
2014
.
R. Degraeve,
G. Groeseneken,
H. Maes,
1998,
1998 Conference on Optoelectronic and Microelectronic Materials and Devices. Proceedings (Cat. No.98EX140).
R. Degraeve,
T. Nigam,
M. Depas,
1997
.
Tanya Nigam,
Marc Heyns,
Michel Houssa,
1998
.
T. Nigam,
James D. Plummer,
J. F. Miner,
2000,
International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138).
Guido Groeseneken,
D. Martin Knotter,
Tanya Nigam,
1999,
IBM J. Res. Dev..
T. Nigam,
Shuming Xu,
A. Shibib,
2004
.
Tanya Nigam,
Peter C. Paliwoda,
Maria Toledano-Luque,
2021,
2021 IEEE International Reliability Physics Symposium (IRPS).
S. F. Yap,
A. Kerber,
T. Nigam,
2017,
International Integrated Reliability Workshop.
T. Nigam,
A. Kerber,
P. Peumans,
2009,
2009 IEEE International Reliability Physics Symposium.
T. Nigam,
A. Kerber,
Y. Liu,
2017,
2017 IEEE International Reliability Physics Symposium (IRPS).
Tanya Nigam,
Marc Heyns,
Michel Houssa,
1999
.
H. P. Urbach,
M. L. Monaghan,
T. Nigam,
2000
.
J. Zeng,
S. Samavedam,
B. Senapati,
2017,
2017 IEEE International Electron Devices Meeting (IEDM).
Tanya Nigam,
M. Heyns,
T. Nigam,
1997
.
Tanya Nigam,
Marc Heyns,
Michel Houssa,
1998
.
T. Nigam,
A. Kornblit,
M.R. Baker,
2001,
International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224).
Tanya Nigam,
T. Nigam,
2009,
2009 IEEE Custom Integrated Circuits Conference.
T. Nigam,
B. Parameshwaran,
G. Krause,
2009,
2009 IEEE International Reliability Physics Symposium.
S. Balasubramanian,
T. Nigam,
J. Higman,
2020,
International Integrated Reliability Workshop.
Fernando Guarin,
T. Nigam,
Andreas Kerber,
2020,
IEEE Transactions on Device and Materials Reliability.
A. Kerber,
T. Nigam,
P. Paliwoda,
2019,
IEEE Transactions on Device and Materials Reliability.
Constant current charge-to-breakdown: Still a valid tool to study the reliability of MOS structures?
R. Degraeve,
M.M. Heyns,
G. Groeseneken,
1998,
1998 IEEE International Reliability Physics Symposium Proceedings. 36th Annual (Cat. No.98CH36173).
Tanya Nigam,
R. Ranjan,
P. Srinivasan,
2018,
2018 IEEE International Reliability Physics Symposium (IRPS).
Tanya Nigam,
Andreas Kerber,
A. Kerber,
2018,
Microelectron. Reliab..
Guido Groeseneken,
Ben Kaczer,
Tanya Nigam,
1999
.
T. Nigam,
R. Degraeve,
B. Kaczer,
1999,
1999 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.99CH36325).
T. Nigam,
T. Shen,
Z. Chbili,
2019,
2019 Electron Devices Technology and Manufacturing Conference (EDTM).
Impact of charge trapping on the voltage acceleration of TDDB in metal gate/high-k n-channel MOSFETs
T. Nigam,
A. Kerber,
D. Lipp,
2010,
2010 IEEE International Reliability Physics Symposium.
Tanya Nigam,
Helmut Puchner,
Kandachar Manjularani,
2006
.
T. Nigam,
T. Nigam,
E. Harris,
2006,
2006 IEEE International Reliability Physics Symposium Proceedings.