J. Higman
发表
A. Haggag,
G. Anderson,
S. Parihar,
2007,
2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual.
J. Higman,
Kuo-tung Chang,
Wei-ming Chen,
1998,
IEEE Electron Device Letters.
S. Selberherr,
R. Dutton,
C. Jungemann,
1994
.
B. Riccò,
C. Fiegna,
A. Abramo,
1992,
NUPAD IV. Workshop on Numerical Modeling of Processes and Devices for Integrated Circuits,.
M. Fischetti,
J. Higman,
1991
.
J. Bude,
J. Higman,
K. Hess,
1991
.
R. Dutton,
J. Higman,
K. Hess,
1989
.
B. Riccò,
C. Fiegna,
A. Abramo,
1991,
International Electron Devices Meeting 1991 [Technical Digest].
D. Burnett,
J. Higman,
A. Hoefler,
2002,
Digest. International Electron Devices Meeting,.
A. Hoefler,
T. Harp,
J. M. Higman,
2002,
2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320).
Tat-Kwan Yu,
Jack Higman,
C. Cavins,
1996,
Proceedings Ninth Annual IEEE International ASIC Conference and Exhibit.
M. Orlowski,
J. Higman,
1993,
31st Annual Proceedings Reliability Physics 1993.
K. W. Kim,
J. Higman,
K. Hess,
1989
.
J. Higman,
K. Hess,
J. Coleman,
1987
.
J. Higman,
K. Hess,
J. Coleman,
1988
.
E. B. Mayfield,
J. Higman,
C. Samson,
1970
.
Zhewei Jiang,
Sanjay Parihar,
Gobinda Saha,
2020,
IEEE Access.
J. Zeng,
S. Samavedam,
B. Senapati,
2017,
2017 IEEE International Electron Devices Meeting (IEDM).
D. Arnold,
M. Schuurmans,
J. Higman,
1990
.
J. Higman,
K. Hess,
I. Kizilyalli,
1988,
IEEE Electron Device Letters.
S. Balasubramanian,
T. Nigam,
J. Higman,
2020,
International Integrated Reliability Workshop.
J. Bude,
J. Higman,
K. Hess,
1992
.