K. Zhao

发表

E. Cartier, V. Narayanan, J. Stathis, 2011, 2011 International Electron Devices Meeting.

J. Shepard, J. Sudijono, S. Krishnan, 2011, 2011 International Electron Devices Meeting.

E. Cartier, V. Narayanan, J. Stathis, 2012, 2012 IEEE International Reliability Physics Symposium (IRPS).

E. Cartier, J. Stathis, A. Kerber, 2010, 2010 IEEE International Reliability Physics Symposium.

Barry P. Linder, Rahul M. Rao, Amlan Ghosh, 2011, 2011 Symposium on VLSI Circuits - Digest of Technical Papers.

S. Grunow, V. Narayanan, J. Bruley, 2015, 2015 IEEE International Electron Devices Meeting (IEDM).

B. Haran, N. Loubet, K. Zhao, 2020, 2020 IEEE International Electron Devices Meeting (IEDM).

James H. Stathis, Kai Zhao, Miaomiao Wang, 2010, Microelectron. Reliab..

D. Daley, L. Wagner, S. Narasimha, 2012, 2012 Symposium on VLSI Technology (VLSIT).

G. Northrop, V. Sardesai, S. Narasimha, 2014, 2014 IEEE International Electron Devices Meeting.

A. Young, B. Haran, T. Hook, 2021, Symposium on VLSI Technology.

C. Park, N. Loubet, B. Haran, 2019, 2019 IEEE International Electron Devices Meeting (IEDM).

A. Kerber, J. H. Stathis, B. P. Linder, 2011, 2011 International Reliability Physics Symposium.