N. Mukherjee
发表
Nilanjan Mukherjee,
Ramesh Karri,
Tapan J. Chakraborty,
1999,
IEEE Commun. Mag..
Ramesh Karri,
Nilanjan Mukherjee,
T Chakrabarti,
1999
.
Nilanjan Mukherjee,
Janusz Rajski,
Daniel Tille,
2019,
2019 IEEE International Test Conference (ITC).
Nilanjan Mukherjee,
Sudhakar M. Reddy,
Janusz Rajski,
2018,
2018 IEEE International Test Conference (ITC).
Nilanjan Mukherjee,
Janusz Rajski,
Jerzy Tyszer,
2001,
IEEE Trans. Computers.
Nilanjan Mukherjee,
Janusz Rajski,
Jerzy Tyszer,
1997,
Proceedings International Test Conference 1997.
Nilanjan Mukherjee,
Janusz Rajski,
Jerzy Tyszer,
2006,
2006 IEEE International Test Conference.
Nilanjan Mukherjee,
Janusz Rajski,
Jerzy Tyszer,
2004,
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.
Nilanjan Mukherjee,
Janusz Rajski,
Jerzy Tyszer,
2002,
Proceedings. International Test Conference.
T. C. Wilson,
N. Mukherjee,
C. T.,
1995,
VLSI Design.
Yu Huang,
G. Aldrich,
N. Mukherjee,
2007,
16th Asian Test Symposium (ATS 2007).
Joseph Rayhawk,
Nilanjan Mukherjee,
Sudhakar M. Reddy,
2004,
17th International Conference on VLSI Design. Proceedings..
Tapan Kumar Hazra,
Ajoy Kumar Chakraborty,
Rumna Samanta,
2017,
2017 8th Annual Industrial Automation and Electromechanical Engineering Conference (IEMECON).
N. Mukherjee,
J. Rajski,
M. Kassab,
2004,
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.
Nilanjan Mukherjee,
Janusz Rajski,
Jerzy Tyszer,
2019,
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.
Nilanjan Mukherjee,
Janusz Rajski,
Jerzy Tyszer,
2017,
2017 IEEE International Test Conference (ITC).
Nilanjan Mukherjee,
Janusz Rajski,
Jerzy Tyszer,
1995,
Proceedings of the IEEE 1995 Custom Integrated Circuits Conference.
Nilanjan Mukherjee,
Sudhakar M. Reddy,
Janusz Rajski,
2016,
2016 IEEE International Test Conference (ITC).
Nilanjan Mukherjee,
Janusz Rajski,
Jerzy Tyszer,
2016,
2016 IEEE International Test Conference (ITC).
Nilanjan Mukherjee,
Friedrich Hapke,
Janusz Rajski,
2016,
IEEE Design & Test.
Nilanjan Mukherjee,
Friedrich Hapke,
Janusz Rajski,
2015,
2015 IEEE International Test Conference (ITC).
Nilanjan Mukherjee,
Janusz Rajski,
Jerzy Tyszer,
2015,
2015 52nd ACM/EDAC/IEEE Design Automation Conference (DAC).
Nilanjan Mukherjee,
Janusz Rajski,
Jerzy Tyszer,
1997,
IEEE Trans. Computers.
Nilanjan Mukherjee,
Sudhakar M. Reddy,
Wu-Tung Cheng,
2001,
Proceedings International Test Conference 2001 (Cat. No.01CH37260).