A. Weber

Data retention analysis on individual cells of 256Mb DRAM i n 110nm technology

A. Weber, A. Birner, W. Krautschneider, 2005, Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005..

Retention Tail Improvement for Gbit DRAMs through Trap Passivation confirmed by Activation Energy Analysis

A. Weber, A. Birner, W. Krautschneider, 2006, 2006 European Solid-State Device Research Conference.

Method of activation energy analysis and application to individual cells of 256Mb DRAM in 110 nm technology

Wolfgang H. Krautschneider, A. Birner, A. Weber, 2006 .