T. Pompl
发表
P. Moll,
H. Reisinger,
T. Hecht,
2001,
International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224).
A. Kerber,
M. Kerber,
T. Pompl,
2006,
IEEE Electron Device Letters.
H. Gossner,
T. Pompl,
K. Chatty,
2007
.
I. Eisele,
Martin Kerber,
Helmut Wurzer,
2000
.
Thomas Pompl,
Wolfgang Stadler,
Kai Esmark,
2007,
2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).
T. Pompl,
W. Hansch,
I. Eisele,
1997
.
M. Ostermayr,
T. Pompl,
R. Strasser,
2015,
IEEE Transactions on Device and Materials Reliability.
Thomas Pompl,
Michael Röhner,
T. Pompl,
2005,
Microelectron. Reliab..
T. Pompl,
K.-H. Allers,
R. Schwab,
2005,
2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual..
M. Kerber,
C. Engel,
H. Wurzer,
2001,
Microelectron. Reliab..
M. Sherony,
T. Schiml,
A. Cowley,
2005,
IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest..
Thomas Pompl,
Martin Kerber,
G. Innertsberger,
2002,
2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320).
M. Kerber,
I. Eisele,
H. Wurzer,
2000,
30th European Solid-State Device Research Conference.
A. Bravaix,
K. Esmark,
T. Brodbeck,
2006,
2006 Electrical Overstress/Electrostatic Discharge Symposium.