J. Ahlbin
发表
peixiong zhao,
P. Gouker,
B. Tyrrell,
2011,
IEEE Transactions on Nuclear Science.
peixiong zhao,
J. Ahlbin,
M. Gadlage,
2009,
2009 IEEE International Reliability Physics Symposium.
R. Reed,
M. Baze,
J. Ahlbin,
2009,
IEEE Transactions on Device and Materials Reliability.
P. Eaton,
J. Ahlbin,
L. Massengill,
2009,
IEEE Transactions on Nuclear Science.
peixiong zhao,
R. Reed,
G. Vizkelethy,
2010,
IEEE Transactions on Nuclear Science.
L. W. Massengill,
B. L. Bhuva,
R. D. Schrimpf,
2010,
2010 IEEE International Reliability Physics Symposium.
The Effect of Layout Topology on Single-Event Transient Pulse Quenching in a 65 nm Bulk CMOS Process
B L Bhuva,
R A Reed,
J R Ahlbin,
2010,
IEEE Transactions on Nuclear Science.
W. T. Holman,
B L Bhuva,
W T Holman,
2011,
IEEE Transactions on Nuclear Science.
J. R. Ahlbin,
P. Gadfort,
J. Ahlbin,
2014,
2014 SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S).
Yu Cao,
Ketul Sutaria,
Mike Shuo-Wei Chen,
2014,
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.
B. L. Bhuva,
L. W. Massengill,
T. D. Loveless,
2011,
IEEE Transactions on Nuclear Science.
B. L. Bhuva,
L. W. Massengill,
T. D. Loveless,
2011,
2011 International Reliability Physics Symposium.
R. Reed,
J. Ahlbin,
L. Massengill,
2009
.
B.L. Bhuva,
A.F. Witulski,
L.W. Massengill,
2007,
IEEE Transactions on Nuclear Science.
Travis J. Anderson,
Michael Bajura,
Cory D. Cress,
2013
.
R A Reed,
R A Weller,
R D Schrimpf,
2011,
IEEE Transactions on Nuclear Science.
L. W. Massengill,
B. L. Bhuva,
B. Narasimham,
2011,
IEEE Transactions on Device and Materials Reliability.
Effect of Well and Substrate Potential Modulation on Single Event Pulse Shape in Deep Submicron CMOS
B.L. Bhuva,
O.A. Amusan,
peixiong zhao,
2007,
IEEE Transactions on Nuclear Science.
L. W. Massengill,
B. L. Bhuva,
T. D. Loveless,
2011,
IEEE Transactions on Nuclear Science.
B. Narasimham,
V. Ramachandran,
B.L. Bhuva,
2009,
IEEE Transactions on Nuclear Science.
B.L. Bhuva,
J.D. Black,
O.A. Amusan,
2008,
2008 IEEE International Reliability Physics Symposium.