M. Imhof

发表

Integrating Scan Design and Soft Error Correction in Low-Power Applications

Hans-Joachim Wunderlich, Michael E. Imhof, Christian G. Zoellin, 2008, 2008 14th IEEE International On-Line Testing Symposium.

Preprint Variation-Aware Fault Grading

H. Wunderlich, M. Imhof, M. Sauer, 2012 .

Reliable Networks On-Chips in the Many-Core Era

M. Imhof, N. Stankovic, 2009 .

Verlustleistung Detection of transient faults in circuits with reduced power dissipation

M. Imhof, 2008 .

High-Throughput Logic Timing Simulation on GPGPUs

Hans-Joachim Wunderlich, Michael E. Imhof, Stefan Holst, 2015, TODE.

Preprint High-Throughput Logic Timing Simulation on GPGPUs

Hans-Joachim Wunderlich, Michael E. Imhof, Stefan Holst, 2015 .

Bit-Flipping Scan — A unified architecture for fault tolerance and offline test

Hans-Joachim Wunderlich, Michael E. Imhof, H. Wunderlich, 2014, 2014 Design, Automation & Test in Europe Conference & Exhibition (DATE).

A pseudo-dynamic comparator for error detection in fault tolerant architectures

Arnaud Virazel, Alberto Bosio, Luigi Dilillo, 2012, 2012 IEEE 30th VLSI Test Symposium (VTS).

Fault tolerance infrastructure and its reuse for offline testing: synergies of a unified architecture to cope with soft errors and hard faults

Michael E. Imhof, M. Imhof, 2015 .

GUARD: GUAranteed reliability in dynamically reconfigurable systems

Jörg Henkel, Hongyan Zhang, Lars Bauer, 2014, 2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC).

GUARD

J. Henkel, H. Wunderlich, M. Imhof, 2014, Proceedings of the The 51st Annual Design Automation Conference on Design Automation Conference - DAC '14.

Test Strategies for Reliable Runtime Reconfigurable Architectures

Jörg Henkel, Hongyan Zhang, Lars Bauer, 2013, IEEE Transactions on Computers.

Scan Test Planning for Power Reduction

Hans-Joachim Wunderlich, Michael E. Imhof, Christian G. Zoellin, 2007, 2007 44th ACM/IEEE Design Automation Conference.

Synthesis of workload monitors for on-line stress prediction

Chang Liu, Hans-Joachim Wunderlich, Michael E. Imhof, 2013, 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS).