Sam D. Huynh

Test set selection for structural faults in analog IC's

Prashant Goteti, Mani Soma, Giri Devarayanadurg, 1999, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

Dynamic test set generation for analog circuits and systems

Seongwon Kim, Mani Soma, Sam D. Huynh, 1998, Proceedings Seventh Asian Test Symposium (ATS'98) (Cat. No.98TB100259).

Testability analysis and multi-frequency ATPG for analog circuits and systems

Seongwon Kim, Mani Soma, Sam D. Huynh, 1998, ICCAD.

A test point insertion algorithm for mixed-signal circuits

Mani Soma, Sam D. Huynh, Jinyan Zhang, 1999, Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146).

Hierarchical ATPG for Analog Circuits and Systems

Seongwon Kim, Mani Soma, Giri Devarayanadurg, 2001, IEEE Des. Test Comput..

Efficient test set design for analog and mixed-signal circuits and systems

Seongwon Kim, Mani Soma, Giri Devarayanadurg, 1999, Proceedings Eighth Asian Test Symposium (ATS'99).