Jong-Ahn Kim

发表

Design methods for six-degree-of-freedom displacement measurement systems using cooperative targets

Soohyun Kim, Yoon Keun Kwak, Euiwon Bae, 2002 .

Six-degree-of-freedom displacement measurement system using a diffraction grating

S. Kim, Y. Kwak, Jong-Ahn Kim, 2000 .

Metrological atomic force microscope using a large range scanning dual stage

Tae Bong Eom, Chu-Shik Kang, Jong-Ahn Kim, 2009 .

Interferometric profile scanning system for measuring large planar mirror surface based on single-interferogram analysis using Fourier transform method

Tae Bong Eom, Chu-Shik Kang, Jong-Ahn Kim, 2018 .

On-Machine Self-calibration of a Two-Dimensional Stage Using an Absolute X–Y–Θ Position Sensor

Jong-Ahn Kim, Jae Wan Kim, C. Kang, 2020 .

Measurement of microscope calibration standards in nanometrology using a metrological atomic force microscope

Byong Chon Park, Tae Bong Eom, Jong-Ahn Kim, 2006 .

A Review of Thickness Measurements of Thick Transparent Layers Using Optical Interferometry

Jong-Ahn Kim, Heulbi Ahn, Jaeseok Bae, 2019, International Journal of Precision Engineering and Manufacturing.

Realization of the kilogram using the KRISS Kibble balance

Jong-Ahn Kim, Sungjun Lee, Myeonghyeon Kim, 2020 .

Note: high precision angle generator using multiple ultrasonic motors and a self-calibratable encoder.

Tae Bong Eom, Chu-Shik Kang, Jong-Ahn Kim, 2011, The Review of scientific instruments.

On-machine calibration of angular position and runout of a precision rotation stage using two absolute position sensors

Jong-Ahn Kim, Jae Wan Kim, C. Kang, 2020 .

Measurements of Two-dimensional Gratings Using a Metrological Atomic Force Microscope with uncertainty Evaluation

Jong-Ahn Kim, Jae Wan Kim, C. Kang, 2008 .

An interferometric calibration system for various linear artefacts using active compensation of angular motion errors

Jong-Ahn Kim, Jae Wan Kim, C. Kang, 2011 .

An interferometric system for measuring thickness of parallel glass plates without 2π ambiguity using phase analysis of quadrature Haidinger fringes.

Jong-Ahn Kim, Jae Wan Kim, C. Kang, 2017, The Review of scientific instruments.

Physical thickness and group refractive index measurement of individual layers for double-stacked microstructures using spectral-domain interferometry

Jong-Ahn Kim, Jaeseok Bae, Jonghan Jin, 2019, Optics Communications.

Vibration-insensitive measurements of the thickness profile of large glass panels.

Jong-Ahn Kim, Jae Wan Kim, Jaeseok Bae, 2015, Optics express.

Fizeau-type interferometric probe to measure geometrical thickness of silicon wafers.

Jong-Ahn Kim, Jae Wan Kim, Jonghan Jin, 2014, Optics express.

Measurement of thickness profile and refractive index variation of a silicon wafer using the optical comb of a femtosecond pulse laser

Jong-Ahn Kim, Jae Wan Kim, Jonghan Jin, 2013 .

Precision depth measurement of through silicon vias (TSVs) on 3D semiconductor packaging process.

Chu-Shik Kang, Jong-Ahn Kim, Jonghan Jin, 2012, Optics express.

An optical straightness measurement sensor for the KRISS watt balance

Jae Wan Kim, Tae Bong Eom, Chu-Shik Kang, 2015 .

Multi-degree-of-freedom displacement measurement system for milli-structures

Euiwon Bae, Soohyun Kim, Jong-Ahn Kim, 2001 .

Gauge block calibration by using a high speed phase shifting interferometer comprising two frequency scanning diode lasers

Jae Wan Kim, Chu-Shik Kang, Jong-Ahn Kim, 2009, Optical Metrology.

THREE DIMENSIONAL PROFILE MEASUREMENT OF FOUR-STEP REFERENCE SPECIMENS USING THE FRINGE SCANNING FOURIER TRANSFORM METHOD

Jong-Ahn Kim, Jae Wan Kim, C. Kang, 2009 .

SPECIMENS USING THE FRINGE SCANNING FOURIER TRANSFORM METHOD

Jong-Ahn Kim, Jae Wan Kim, C. Kang, 2009 .

Design of the KRISS watt balance

Kee-Bong Choi, Jong-Ahn Kim, Byung-Chill Woo, 2014 .

A 50 m laser interferometer for automatic calibration of surveying tapes using wireless communication

Don Young Jeong, Jong-Ahn Kim, Jae Wan Kim, 2007 .

Measurement of Six-Degree-of-Freedom Absolute Postures Using a Phase-Encoded Pattern Target and a Monocular Vision System

Jong-Ahn Kim, C. Kang, Jae Yong Lee, 2023, International Journal of Precision Engineering and Manufacturing.

High-speed double-slit interferometer using a position sensitive detector for in-line thickness variation measurement of glass panels

Jong-Ahn Kim, Jae Wan Kim, C. Kang, 2015 .

High-speed double-slit interferometer using a position sensitive detector for in-line thickness variation measurement of glass panels

Jong-Ahn Kim, Jae Wan Kim, C. Kang, 2015, International Journal of Precision Engineering and Manufacturing.

Quadrature laser interferometer for in-line thickness measurement of glass panels using a current modulation technique.

Jong-Ahn Kim, Jae Wan Kim, C. Kang, 2014, Applied optics.

Vibration-insensitive measurement of thickness variation of glass panels using double-slit interferometry.

Jong-Ahn Kim, Jae Wan Kim, C. Kang, 2014, Optics express.

High resolution interferometer with multiple-pass optical configuration.

Jong-Ahn Kim, C. Kang, Jaewan Kim, 2009, Optics express.

A Review of Thickness Measurements of Thick Transparent Layers Using Optical Interferometry

Jong-Ahn Kim, Heulbi Ahn, Jaeseok Bae, 2019, International Journal of Precision Engineering and Manufacturing.

Calibration of angle artifacts and instruments using a high precision angle generator

Jae Wan Kim, Tae Bong Eom, Chu-Shik Kang, 2013 .

An interferometric Abbe-type comparator for the calibration of internal and external diameter standards

Tae Bong Eom, Chu-Shik Kang, Jong-Ahn Kim, 2010 .

Optical gauge block metrology in KRISS

Jong-Ahn Kim, Jae Wan Kim, C. Kang, 2007 .

APMP L-K4 Key Comparison, Calibration of diameter standards

Toshiyuki Takatsuji, Peter Cox, K P Chaudhary, 2014 .

A passive method to compensate nonlinearity in a homodyne interferometer.

Soohyun Kim, Chu-Shik Kang, Jong-Ahn Kim, 2009, Optics express.

Time-of-flight measurement-based three-dimensional profiler system employing a lightweight Fresnel-type Risley prism scanner

Jae Heun Woo, Jong-Ahn Kim, Jae Wan Kim, 2022 .