Y. Yue

A new extrapolation method for long-term degradation prediction of deep-submicron MOSFETs

Juin J. Liou, Zhi Cui, Y. Yue, 2003 .

An improved model for four-terminal junction field-effect transistors

Juin J. Liou, Y. Yue, J. Liou, 1996 .

New simple procedure to determine the threshold voltage of MOSFETs

Juin J. Liou, Adelmo Ortiz-Conde, F. J. Garcia Sanchez, 2000 .

High‐level injection in quasi‐neutral region of n/p junction devices: Numerical results and empirical model

Juin J. Liou, Adelmo Ortiz-Conde, Y. Yue, 1995 .